K. Yoh, H. Taniguchi, K. Kiyomi, M. Inoue, R. Sakamoto
{"title":"InAs异质结量子线中77k的一维电子输运和漏极电流量子化","authors":"K. Yoh, H. Taniguchi, K. Kiyomi, M. Inoue, R. Sakamoto","doi":"10.1109/IEDM.1991.235300","DOIUrl":null,"url":null,"abstract":"The authors have fabricated quantum wires on the InAs/AlGaSb heterostructure by utilizing electron beam lithography and wet-chemical etching. The electron confinement into quasi-one-dimensional freedom of motion was verified by magnetoresistance measurement at 4.2 K. In two terminal devices with extremely narrow channel structure, quantized drain current through drain-induced barrier lowering has been observed at 77 K. Coulomb oscillations and Coulomb staircases were seen to overlap with staircase u characteristics reflecting the small parasitic capacitance between terminals. Material, structural, and temperature effects on these devices were examined.<<ETX>>","PeriodicalId":13885,"journal":{"name":"International Electron Devices Meeting 1991 [Technical Digest]","volume":"15 1","pages":"813-816"},"PeriodicalIF":0.0000,"publicationDate":"1991-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"One dimensional electron transport and drain current quantization at 77 K in InAs heterojunction quantum wires\",\"authors\":\"K. Yoh, H. Taniguchi, K. Kiyomi, M. Inoue, R. Sakamoto\",\"doi\":\"10.1109/IEDM.1991.235300\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors have fabricated quantum wires on the InAs/AlGaSb heterostructure by utilizing electron beam lithography and wet-chemical etching. The electron confinement into quasi-one-dimensional freedom of motion was verified by magnetoresistance measurement at 4.2 K. In two terminal devices with extremely narrow channel structure, quantized drain current through drain-induced barrier lowering has been observed at 77 K. Coulomb oscillations and Coulomb staircases were seen to overlap with staircase u characteristics reflecting the small parasitic capacitance between terminals. Material, structural, and temperature effects on these devices were examined.<<ETX>>\",\"PeriodicalId\":13885,\"journal\":{\"name\":\"International Electron Devices Meeting 1991 [Technical Digest]\",\"volume\":\"15 1\",\"pages\":\"813-816\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Electron Devices Meeting 1991 [Technical Digest]\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1991.235300\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Electron Devices Meeting 1991 [Technical Digest]","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1991.235300","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
One dimensional electron transport and drain current quantization at 77 K in InAs heterojunction quantum wires
The authors have fabricated quantum wires on the InAs/AlGaSb heterostructure by utilizing electron beam lithography and wet-chemical etching. The electron confinement into quasi-one-dimensional freedom of motion was verified by magnetoresistance measurement at 4.2 K. In two terminal devices with extremely narrow channel structure, quantized drain current through drain-induced barrier lowering has been observed at 77 K. Coulomb oscillations and Coulomb staircases were seen to overlap with staircase u characteristics reflecting the small parasitic capacitance between terminals. Material, structural, and temperature effects on these devices were examined.<>