N. Matsuo, Y. Nakata, H. Ogawa, T. Yabu, S. Matsumoto, M. Sasago, K. Hashimoto, S. Okada
{"title":"扩展垂直电容单元(SVC)用于超过64 Mbit的dram","authors":"N. Matsuo, Y. Nakata, H. Ogawa, T. Yabu, S. Matsumoto, M. Sasago, K. Hashimoto, S. Okada","doi":"10.1109/IEDM.1991.235353","DOIUrl":null,"url":null,"abstract":"An advanced three-dimensionally (3-D) stacked capacitor cell, SVC, was developed. The SVC shows good electrical characteristics, and it realized a capacitance of 43 fF with a cell area of 1.8 mu m/sup 2/. The uniform formation of the capacitor-dielectric-film (oxide-nitride-oxide film: ONO) on the experimental storage electrode indicates the uniform deposition of the ONO film on all kinds of 3-D storage electrodes including that of the SVC. The SVC is the most promising cell structure for beyond 64 Mbit DRAMs (dynamic RAMs).<<ETX>>","PeriodicalId":13885,"journal":{"name":"International Electron Devices Meeting 1991 [Technical Digest]","volume":"52 1","pages":"473-476"},"PeriodicalIF":0.0000,"publicationDate":"1991-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Spreaded-vertical-capacitor cell (SVC) for beyond 64 Mbit DRAMs\",\"authors\":\"N. Matsuo, Y. Nakata, H. Ogawa, T. Yabu, S. Matsumoto, M. Sasago, K. Hashimoto, S. Okada\",\"doi\":\"10.1109/IEDM.1991.235353\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An advanced three-dimensionally (3-D) stacked capacitor cell, SVC, was developed. The SVC shows good electrical characteristics, and it realized a capacitance of 43 fF with a cell area of 1.8 mu m/sup 2/. The uniform formation of the capacitor-dielectric-film (oxide-nitride-oxide film: ONO) on the experimental storage electrode indicates the uniform deposition of the ONO film on all kinds of 3-D storage electrodes including that of the SVC. The SVC is the most promising cell structure for beyond 64 Mbit DRAMs (dynamic RAMs).<<ETX>>\",\"PeriodicalId\":13885,\"journal\":{\"name\":\"International Electron Devices Meeting 1991 [Technical Digest]\",\"volume\":\"52 1\",\"pages\":\"473-476\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Electron Devices Meeting 1991 [Technical Digest]\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1991.235353\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Electron Devices Meeting 1991 [Technical Digest]","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1991.235353","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Spreaded-vertical-capacitor cell (SVC) for beyond 64 Mbit DRAMs
An advanced three-dimensionally (3-D) stacked capacitor cell, SVC, was developed. The SVC shows good electrical characteristics, and it realized a capacitance of 43 fF with a cell area of 1.8 mu m/sup 2/. The uniform formation of the capacitor-dielectric-film (oxide-nitride-oxide film: ONO) on the experimental storage electrode indicates the uniform deposition of the ONO film on all kinds of 3-D storage electrodes including that of the SVC. The SVC is the most promising cell structure for beyond 64 Mbit DRAMs (dynamic RAMs).<>