{"title":"ESD传输通过以太网的磁性","authors":"N. Pischl","doi":"10.1109/ISEMC.2005.1513539","DOIUrl":null,"url":null,"abstract":"Ethernet transceivers are connected to twisted-pair cables by magnetics, which typically contain pulse transformers, common mode chokes, capacitors and resistors. Voltage waveforms on the transceiver-side of magnetics due to electrostatic discharge to the cable-side pins of an integrated Ethernet connector have been measured. 200 m CAT5 unshielded and shielded twisted-pair cables were used. Effect of proximity of the cable to grounded metal carrier in a cable rack was observed. Three methods of discharge to the connector pins are compared: contact-discharge of an ESD-gun, manual discharge of the cables, and cable-discharge using an automatic setup that employs high-voltage relays. The results can also help standardizing the test procedure.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"11 1","pages":"356-363 Vol. 2"},"PeriodicalIF":0.0000,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"ESD transfer through Ethernet magnetics\",\"authors\":\"N. Pischl\",\"doi\":\"10.1109/ISEMC.2005.1513539\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Ethernet transceivers are connected to twisted-pair cables by magnetics, which typically contain pulse transformers, common mode chokes, capacitors and resistors. Voltage waveforms on the transceiver-side of magnetics due to electrostatic discharge to the cable-side pins of an integrated Ethernet connector have been measured. 200 m CAT5 unshielded and shielded twisted-pair cables were used. Effect of proximity of the cable to grounded metal carrier in a cable rack was observed. Three methods of discharge to the connector pins are compared: contact-discharge of an ESD-gun, manual discharge of the cables, and cable-discharge using an automatic setup that employs high-voltage relays. The results can also help standardizing the test procedure.\",\"PeriodicalId\":6459,\"journal\":{\"name\":\"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.\",\"volume\":\"11 1\",\"pages\":\"356-363 Vol. 2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-10-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2005.1513539\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2005.1513539","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Ethernet transceivers are connected to twisted-pair cables by magnetics, which typically contain pulse transformers, common mode chokes, capacitors and resistors. Voltage waveforms on the transceiver-side of magnetics due to electrostatic discharge to the cable-side pins of an integrated Ethernet connector have been measured. 200 m CAT5 unshielded and shielded twisted-pair cables were used. Effect of proximity of the cable to grounded metal carrier in a cable rack was observed. Three methods of discharge to the connector pins are compared: contact-discharge of an ESD-gun, manual discharge of the cables, and cable-discharge using an automatic setup that employs high-voltage relays. The results can also help standardizing the test procedure.
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