指纹传感器封装用高介电常数模塑化合物

T. Tang, Kelly Chen, K. Tsai, Max Lu, Jensen Tsai, Yu-Po Wang
{"title":"指纹传感器封装用高介电常数模塑化合物","authors":"T. Tang, Kelly Chen, K. Tsai, Max Lu, Jensen Tsai, Yu-Po Wang","doi":"10.1109/ECTC.2018.00142","DOIUrl":null,"url":null,"abstract":"Biometric features, such as fingerprint, facial recognition, etc, are convenient personal identification methods in mobile electronics. Fingerprint recognition is one of mature technologies and is embedded in an increasing number of mobile devices. For fingerprint sensor packaging, wire bonding and over-molding Land Grid Array (LGA) is one of major package types. Inside the wire bond LGA package, the dielectric constant (Dk) of over-molding compounds is one dominant factor for the sensitivity of capacitive fingerprint sensors. Normal molding compounds contain epoxy base polymers and silica base fillers. Their Dk value is relative low (3~5 at 1 MHz). Those compounds are suitable for the general encapsulation purpose. But they have shielding effects on the sensing signal transmission in capacitive fingerprint sensor packages. This shielding effect needs to be reduced as much as possible, especially when thick glass is used on fingerprint module for the mechanical protection. Therefore, high Dk (7~40 at 1 MHz) molding compounds were developed for the sensor performance enhancement. High Dk property of molding compound can be achieved by using new type polymers and metal oxide fillers. With new type polymers and fillers, the major challenges of high Dk molding compounds come from the warpage and stress during the package assembly process. In order to diminish the warpage and stress, lots of experiments were conducted which including molding compound composition adjustment, post-mold cure process optimization and so on. In this paper, several types of high dielectric constant molding compounds were evaluated and compared. Stress simulations were performed to determine the package construction. Screen and corner DoEs of molding process parameters were conducted to come out the process window. Functional test and reliability test have been preformed as well. Two types of high Dk molding compounds have proven to be feasible and reliable materials for enhancing the performance of fingerprint sensors.","PeriodicalId":6555,"journal":{"name":"2018 IEEE 68th Electronic Components and Technology Conference (ECTC)","volume":"39 1","pages":"926-931"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High Dielectric Constant Molding Compounds for Fingerprint Sensor Packages\",\"authors\":\"T. Tang, Kelly Chen, K. Tsai, Max Lu, Jensen Tsai, Yu-Po Wang\",\"doi\":\"10.1109/ECTC.2018.00142\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Biometric features, such as fingerprint, facial recognition, etc, are convenient personal identification methods in mobile electronics. Fingerprint recognition is one of mature technologies and is embedded in an increasing number of mobile devices. For fingerprint sensor packaging, wire bonding and over-molding Land Grid Array (LGA) is one of major package types. Inside the wire bond LGA package, the dielectric constant (Dk) of over-molding compounds is one dominant factor for the sensitivity of capacitive fingerprint sensors. Normal molding compounds contain epoxy base polymers and silica base fillers. Their Dk value is relative low (3~5 at 1 MHz). Those compounds are suitable for the general encapsulation purpose. But they have shielding effects on the sensing signal transmission in capacitive fingerprint sensor packages. This shielding effect needs to be reduced as much as possible, especially when thick glass is used on fingerprint module for the mechanical protection. Therefore, high Dk (7~40 at 1 MHz) molding compounds were developed for the sensor performance enhancement. High Dk property of molding compound can be achieved by using new type polymers and metal oxide fillers. With new type polymers and fillers, the major challenges of high Dk molding compounds come from the warpage and stress during the package assembly process. In order to diminish the warpage and stress, lots of experiments were conducted which including molding compound composition adjustment, post-mold cure process optimization and so on. In this paper, several types of high dielectric constant molding compounds were evaluated and compared. Stress simulations were performed to determine the package construction. Screen and corner DoEs of molding process parameters were conducted to come out the process window. Functional test and reliability test have been preformed as well. Two types of high Dk molding compounds have proven to be feasible and reliable materials for enhancing the performance of fingerprint sensors.\",\"PeriodicalId\":6555,\"journal\":{\"name\":\"2018 IEEE 68th Electronic Components and Technology Conference (ECTC)\",\"volume\":\"39 1\",\"pages\":\"926-931\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 68th Electronic Components and Technology Conference (ECTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.2018.00142\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 68th Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2018.00142","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

生物特征,如指纹、面部识别等,是移动电子中方便的个人识别方法。指纹识别是一项成熟的技术,越来越多的移动设备中嵌入了指纹识别技术。对于指纹传感器封装来说,线键合和覆盖成型的栅格阵列(LGA)是主要的封装类型之一。在线键合LGA封装中,过模化合物的介电常数(Dk)是影响电容式指纹传感器灵敏度的主要因素。普通成型化合物含有环氧基聚合物和硅基填料。它们的Dk值相对较低(1 MHz时为3~5)。这些化合物适用于一般包封用途。但它们对电容式指纹传感器封装中的传感信号传输有屏蔽作用。这种屏蔽效果需要尽可能的降低,特别是当指纹模块使用厚玻璃进行机械保护时。因此,为了提高传感器的性能,开发了高Dk (7~40 at 1 MHz)的成型化合物。采用新型聚合物和金属氧化物填料可获得高Dk性能的模塑复合材料。随着新型聚合物和填料的出现,高Dk成型化合物的主要挑战来自封装组装过程中的翘曲和应力。为了减少翘曲和应力,进行了大量的试验,包括模塑复合成分的调整,模后固化工艺的优化等。本文对几种高介电常数模塑化合物进行了评价和比较。通过应力模拟来确定包的结构。对成型工艺参数进行了筛角分析,得出了工艺窗口。并进行了功能试验和可靠性试验。两种高Dk模塑化合物已被证明是提高指纹传感器性能的可行和可靠的材料。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High Dielectric Constant Molding Compounds for Fingerprint Sensor Packages
Biometric features, such as fingerprint, facial recognition, etc, are convenient personal identification methods in mobile electronics. Fingerprint recognition is one of mature technologies and is embedded in an increasing number of mobile devices. For fingerprint sensor packaging, wire bonding and over-molding Land Grid Array (LGA) is one of major package types. Inside the wire bond LGA package, the dielectric constant (Dk) of over-molding compounds is one dominant factor for the sensitivity of capacitive fingerprint sensors. Normal molding compounds contain epoxy base polymers and silica base fillers. Their Dk value is relative low (3~5 at 1 MHz). Those compounds are suitable for the general encapsulation purpose. But they have shielding effects on the sensing signal transmission in capacitive fingerprint sensor packages. This shielding effect needs to be reduced as much as possible, especially when thick glass is used on fingerprint module for the mechanical protection. Therefore, high Dk (7~40 at 1 MHz) molding compounds were developed for the sensor performance enhancement. High Dk property of molding compound can be achieved by using new type polymers and metal oxide fillers. With new type polymers and fillers, the major challenges of high Dk molding compounds come from the warpage and stress during the package assembly process. In order to diminish the warpage and stress, lots of experiments were conducted which including molding compound composition adjustment, post-mold cure process optimization and so on. In this paper, several types of high dielectric constant molding compounds were evaluated and compared. Stress simulations were performed to determine the package construction. Screen and corner DoEs of molding process parameters were conducted to come out the process window. Functional test and reliability test have been preformed as well. Two types of high Dk molding compounds have proven to be feasible and reliable materials for enhancing the performance of fingerprint sensors.
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