B. Moralejo, A. Tejero, O. Martínez, M. González, J. Jiménez, V. Parra
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Low-cost system for full-wafer photoluminescence characterization of photovoltaic silicon
Photoluminescence imaging technique has recently emerged as a powerful tool for obtaining very quick sorting of silicon based solar wafers and cells. In this work, we report on a low-cost photoluminescence imaging system, paying special attention to the different constituting elements. Results on both commercial multicrystalline (mc) and seed-monocast (sm) Si wafers and solar cells are discussed.