三维细胞地形模拟的优化算法

W. Pyka, R. Martins, S. Selberherr
{"title":"三维细胞地形模拟的优化算法","authors":"W. Pyka, R. Martins, S. Selberherr","doi":"10.1109/TCAD.1996.6449177","DOIUrl":null,"url":null,"abstract":"The reduction of computing time without loss of accuracy is a very important task for three-dimensional process simulation. We present new approaches for fast and stable simulation of etching and deposition processes by introducing non spherical structuring element algorithms to our morphological operation based cellular topography simulator. We demonstrate improvements and accelerations for a wide variety of etching and deposition models such as isotropic deposition, uni-directional etching, lithography development simulation, sputter deposition and reactive ion etching. we also draw comparisons with the originally implemented algorithm and other approaches such as the level set method. furthermore we show a fast, physically based, and accurate three-dimensional simulation of tin sputter deposition and, by means of a two metal layer interconnect structure, we demonstrate an efficient generation of three-dimensional geometries directly including layout information and photolithography simulation.","PeriodicalId":100835,"journal":{"name":"Journal of Technology Computer Aided Design TCAD","volume":"5 1","pages":"1-39"},"PeriodicalIF":0.0000,"publicationDate":"1996-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Optimized algorithms for three-dimensional cellular topography simulation\",\"authors\":\"W. Pyka, R. Martins, S. Selberherr\",\"doi\":\"10.1109/TCAD.1996.6449177\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The reduction of computing time without loss of accuracy is a very important task for three-dimensional process simulation. We present new approaches for fast and stable simulation of etching and deposition processes by introducing non spherical structuring element algorithms to our morphological operation based cellular topography simulator. We demonstrate improvements and accelerations for a wide variety of etching and deposition models such as isotropic deposition, uni-directional etching, lithography development simulation, sputter deposition and reactive ion etching. we also draw comparisons with the originally implemented algorithm and other approaches such as the level set method. furthermore we show a fast, physically based, and accurate three-dimensional simulation of tin sputter deposition and, by means of a two metal layer interconnect structure, we demonstrate an efficient generation of three-dimensional geometries directly including layout information and photolithography simulation.\",\"PeriodicalId\":100835,\"journal\":{\"name\":\"Journal of Technology Computer Aided Design TCAD\",\"volume\":\"5 1\",\"pages\":\"1-39\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Technology Computer Aided Design TCAD\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TCAD.1996.6449177\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Technology Computer Aided Design TCAD","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TCAD.1996.6449177","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

摘要

在不损失计算精度的情况下减少计算时间是三维过程模拟的一个重要任务。我们提出了一种新的方法来快速和稳定地模拟蚀刻和沉积过程,通过引入非球面结构单元算法,我们的形态学操作为基础的细胞地形模拟器。我们展示了各种蚀刻和沉积模型的改进和加速,如各向同性沉积、单向蚀刻、光刻开发模拟、溅射沉积和反应离子蚀刻。我们还与最初实现的算法和其他方法(如水平集方法)进行了比较。此外,我们展示了锡溅射沉积的快速,基于物理的,准确的三维模拟,并通过两个金属层互连结构,我们展示了直接生成三维几何图形的有效方法,包括布局信息和光刻模拟。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Optimized algorithms for three-dimensional cellular topography simulation
The reduction of computing time without loss of accuracy is a very important task for three-dimensional process simulation. We present new approaches for fast and stable simulation of etching and deposition processes by introducing non spherical structuring element algorithms to our morphological operation based cellular topography simulator. We demonstrate improvements and accelerations for a wide variety of etching and deposition models such as isotropic deposition, uni-directional etching, lithography development simulation, sputter deposition and reactive ion etching. we also draw comparisons with the originally implemented algorithm and other approaches such as the level set method. furthermore we show a fast, physically based, and accurate three-dimensional simulation of tin sputter deposition and, by means of a two metal layer interconnect structure, we demonstrate an efficient generation of three-dimensional geometries directly including layout information and photolithography simulation.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信