T. Nittono, K. Nagata, Y. Yamauchi, T. Makimura, H. Ito, O. Nakajima
{"title":"先进的集成电路制造技术,采用可靠,小尺寸,高速AlGaAs/GaAs HBTs","authors":"T. Nittono, K. Nagata, Y. Yamauchi, T. Makimura, H. Ito, O. Nakajima","doi":"10.1109/IEDM.1991.235273","DOIUrl":null,"url":null,"abstract":"Reliable, small-size, and high-speed AlGaAs/GaAs HBTs (heterojunction bipolar transistors) have been developed using a carbon-doped thin base layer and O/sup +/-implant E/B (emitter/base) junction isolation. This isolation reduces the recombination current at the implanted edge, resulting in improved current gain. The use of carbon dopant for the base layer improves device reliability. A thin (0.04 mu m) base reduces base transit time, making it possible to achieve a high cutoff frequency of 103 GHz. A one-by-eight static frequency divider and a one-by-four/one-by-five two-modulus prescaler fabricated to investigate circuit performance successfully operated over 10 GHz. The 1- mu m*2.4- mu m emitters used in the divider are the smallest HBT applied to ICs ever reported. This result indicates that the proposed technology is promising for the development of reliable and high-speed HBT ICs.<<ETX>>","PeriodicalId":13885,"journal":{"name":"International Electron Devices Meeting 1991 [Technical Digest]","volume":"36 1","pages":"931-934"},"PeriodicalIF":0.0000,"publicationDate":"1991-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Advanced IC fabrication technology using reliable, small-size, and high-speed AlGaAs/GaAs HBTs\",\"authors\":\"T. Nittono, K. Nagata, Y. Yamauchi, T. Makimura, H. Ito, O. Nakajima\",\"doi\":\"10.1109/IEDM.1991.235273\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Reliable, small-size, and high-speed AlGaAs/GaAs HBTs (heterojunction bipolar transistors) have been developed using a carbon-doped thin base layer and O/sup +/-implant E/B (emitter/base) junction isolation. This isolation reduces the recombination current at the implanted edge, resulting in improved current gain. The use of carbon dopant for the base layer improves device reliability. A thin (0.04 mu m) base reduces base transit time, making it possible to achieve a high cutoff frequency of 103 GHz. A one-by-eight static frequency divider and a one-by-four/one-by-five two-modulus prescaler fabricated to investigate circuit performance successfully operated over 10 GHz. The 1- mu m*2.4- mu m emitters used in the divider are the smallest HBT applied to ICs ever reported. This result indicates that the proposed technology is promising for the development of reliable and high-speed HBT ICs.<<ETX>>\",\"PeriodicalId\":13885,\"journal\":{\"name\":\"International Electron Devices Meeting 1991 [Technical Digest]\",\"volume\":\"36 1\",\"pages\":\"931-934\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Electron Devices Meeting 1991 [Technical Digest]\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1991.235273\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Electron Devices Meeting 1991 [Technical Digest]","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1991.235273","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Advanced IC fabrication technology using reliable, small-size, and high-speed AlGaAs/GaAs HBTs
Reliable, small-size, and high-speed AlGaAs/GaAs HBTs (heterojunction bipolar transistors) have been developed using a carbon-doped thin base layer and O/sup +/-implant E/B (emitter/base) junction isolation. This isolation reduces the recombination current at the implanted edge, resulting in improved current gain. The use of carbon dopant for the base layer improves device reliability. A thin (0.04 mu m) base reduces base transit time, making it possible to achieve a high cutoff frequency of 103 GHz. A one-by-eight static frequency divider and a one-by-four/one-by-five two-modulus prescaler fabricated to investigate circuit performance successfully operated over 10 GHz. The 1- mu m*2.4- mu m emitters used in the divider are the smallest HBT applied to ICs ever reported. This result indicates that the proposed technology is promising for the development of reliable and high-speed HBT ICs.<>