Benjamin Odari, Robinson Musembi, M. Mageto, H. Othieno, F. Gaitho, M. Mghendi, Valentine Muramba
{"title":"喷雾热解法沉积f共掺杂PTO薄膜的光电性能","authors":"Benjamin Odari, Robinson Musembi, M. Mageto, H. Othieno, F. Gaitho, M. Mghendi, Valentine Muramba","doi":"10.5923/J.MATERIALS.20130304.05","DOIUrl":null,"url":null,"abstract":"F-co-doped Palladiu m Tin Oxide (PTO) thin films were pyrolytically deposited on glass substrate at 450 0 C using an alcoholic precursor solution consisting of Tin (IV) Chloride (SnCl4.5H2O), Palladiu m Ch loride (Pd Cl2) and Ammoniu m Fluoride (NH4F). A resistivity of 0.3-6.9×10 -2 Ωcm was obtained in F-co-doped PTO films prepared with a Pd content of 3.68at% and F content of 0 - 23.96at% under optimized conditions. The optical properties were studied in the UV/ VIS/ NIR region. The optical bandgap of the films laid in the range 3.945 - 4.014 eV. Using dispersion analysis with Drude and Kim terms, optical constants were determined fro m spectro-photometric measurements for films on glass.","PeriodicalId":7420,"journal":{"name":"American Journal of Materials Science","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Optoelectronic Properties of F-co-doped PTO Thin Films Deposited by Spray Pyrolysis\",\"authors\":\"Benjamin Odari, Robinson Musembi, M. Mageto, H. Othieno, F. Gaitho, M. Mghendi, Valentine Muramba\",\"doi\":\"10.5923/J.MATERIALS.20130304.05\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"F-co-doped Palladiu m Tin Oxide (PTO) thin films were pyrolytically deposited on glass substrate at 450 0 C using an alcoholic precursor solution consisting of Tin (IV) Chloride (SnCl4.5H2O), Palladiu m Ch loride (Pd Cl2) and Ammoniu m Fluoride (NH4F). A resistivity of 0.3-6.9×10 -2 Ωcm was obtained in F-co-doped PTO films prepared with a Pd content of 3.68at% and F content of 0 - 23.96at% under optimized conditions. The optical properties were studied in the UV/ VIS/ NIR region. The optical bandgap of the films laid in the range 3.945 - 4.014 eV. Using dispersion analysis with Drude and Kim terms, optical constants were determined fro m spectro-photometric measurements for films on glass.\",\"PeriodicalId\":7420,\"journal\":{\"name\":\"American Journal of Materials Science\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"American Journal of Materials Science\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.5923/J.MATERIALS.20130304.05\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"American Journal of Materials Science","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5923/J.MATERIALS.20130304.05","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Optoelectronic Properties of F-co-doped PTO Thin Films Deposited by Spray Pyrolysis
F-co-doped Palladiu m Tin Oxide (PTO) thin films were pyrolytically deposited on glass substrate at 450 0 C using an alcoholic precursor solution consisting of Tin (IV) Chloride (SnCl4.5H2O), Palladiu m Ch loride (Pd Cl2) and Ammoniu m Fluoride (NH4F). A resistivity of 0.3-6.9×10 -2 Ωcm was obtained in F-co-doped PTO films prepared with a Pd content of 3.68at% and F content of 0 - 23.96at% under optimized conditions. The optical properties were studied in the UV/ VIS/ NIR region. The optical bandgap of the films laid in the range 3.945 - 4.014 eV. Using dispersion analysis with Drude and Kim terms, optical constants were determined fro m spectro-photometric measurements for films on glass.
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