用于检测故障攻击的大块内置传感器

2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) Pub Date : 2013-06-02 DOI:10.1109/HST.2013.6581565

R. P. Bastos, F. Sill, J. Dutertre, M. Flottes, G. D. Natale, B. Rouzeyre

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引用次数: 20

摘要

本工作提出了一种新的内置电流传感器(BICS)方案，用于检测短时间和长时间以及来自不同同时源的瞬态故障攻击。新的传感器是一个单一的机制，连接到PMOS和NMOS块的监测逻辑。所提出的保护策略也可用于改进任何最先进的Bulk-BICS，从PMOS和NMOS传感器对到单个传感器。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A bulk built-in sensor for detection of fault attacks

This work presents a novel scheme of built-in current sensor (BICS) for detecting transient fault-based attacks of short and long duration as well as from different simultaneous sources. The new sensor is a single mechanism connected to PMOS and NMOS bulks of the monitored logic. The proposed protection strategy is also useful for improving any state-of-the-art Bulk-BICS from pairs of PMOS and NMOS sensors to single sensors.

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2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST)

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