使用结构化文本扩展的PLC硬件在环测试的概念

2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Pub Date : 2017-09-01 DOI:10.1109/ETFA.2017.8247580

David Thönnessen, Niklas Reinker, Stefan Rakel, S. Kowalewski

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引用次数: 3

摘要

硬件在环仿真(HiL)是一种有效的方法来降低系统故障的风险，从而导致昂贵的损失。许多现有的HiL工具要求测试人员使用专有的测试规范语言，这些语言通常是PLC程序员所不知道的。本文提出了一种使用IEC 61131-3规定的编程语言编写HiL测试规范的新方法。通过这样做，PLC程序员能够在他们已经熟悉的领域中指定测试用例。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A concept for PLC hardware-in-the-loop testing using an extension of structured text

Hardware-in-the-loop (HiL) Simulation is a powerful method to reduce the risk of system failures leading to expensive damages. Many existing HiL tools require the tester to use proprietary test specification languages, usually unknown to the domain of a PLC programmer. This work presents a novel approach of HiL test specification using programming languages specified by IEC 61131-3. By doing this, PLC programmers are able to specify test cases in the domain they are already familiar with.

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来源期刊

2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)

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