晶体尺寸随试样表面以下深度的变化对x射线谱线展宽的影响

B. Smith
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引用次数: 0

摘要

对于具有有限吸收系数的晶粒,计算了x射线衍射线的宽度,并通过反射面将其分成平行的晶片,其厚度随表面以下深度的变化而非随机变化。预测的“表观”晶体尺寸是布拉格角θ的函数。对轻磨镍的x射线和硬度测量结果为该理论提供了定性支持。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The effect on X-ray line broadening of variation of crystallite size with depth below the specimen surface
The breadth of an x-ray diffraction line has been calculated for a grain having a finite absorption coefficient and divided by reflecting planes into parallel crystallite slabs whose thickness varies in a non-random manner with depth below the surface. The predicted `apparent' crystallite size is a function of the Bragg angle θ. Qualitative support is given to the theory by the results of x-ray and hardness measurements on lightly abraded nickel.
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