Sabera Fahmida Shiba, J. Beavers, D. Laramore, Bo Lindstrom, James Brovles, Corey Gaither, Tyler Hieber, J. Kim
{"title":"UV-LED光刻系统及其特性","authors":"Sabera Fahmida Shiba, J. Beavers, D. Laramore, Bo Lindstrom, James Brovles, Corey Gaither, Tyler Hieber, J. Kim","doi":"10.1109/NEMS50311.2020.9265607","DOIUrl":null,"url":null,"abstract":"This paper presents a design, system setup, characterization, and microfabrication of high-intensity UV-LED microlithography. Since the high enough intensity of the UV light enables even a millimeter thick SU-8 photoresist process, an array of high-intensity UV-LEDs has been optimized as a light source of the microlithography system. A simple waveguide with a single optical lens has made light collimation without high attenuation of the light intensity while the rotation of the light source provides uniform light distribution. Adopting the x-y-z-r stage to the light source enables a mask aligning function together with light intensity and exposure time controllers. The maximum intensity of 448 mW/cm2 has been measured and the light collimation has been achieved within 5°. The uniform light distribution was measured without and with light rotation. The rotating light source resulted in approximately 29% better than the no-rotation case. The LED source has been stable over 100 hours of operation. The test microstructures include 3 μm lines, high-aspect-ratio micropillars, and 2-mm tall SU-8 pillar array. The proposed system has great flexibility and versatility as a mask aligner system that can be used as both conventional and MEMS microfabrication.","PeriodicalId":6787,"journal":{"name":"2020 IEEE 15th International Conference on Nano/Micro Engineered and Molecular System (NEMS)","volume":"11 1","pages":"73-76"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"UV-LED Lithography System and Characterization\",\"authors\":\"Sabera Fahmida Shiba, J. Beavers, D. Laramore, Bo Lindstrom, James Brovles, Corey Gaither, Tyler Hieber, J. Kim\",\"doi\":\"10.1109/NEMS50311.2020.9265607\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a design, system setup, characterization, and microfabrication of high-intensity UV-LED microlithography. Since the high enough intensity of the UV light enables even a millimeter thick SU-8 photoresist process, an array of high-intensity UV-LEDs has been optimized as a light source of the microlithography system. A simple waveguide with a single optical lens has made light collimation without high attenuation of the light intensity while the rotation of the light source provides uniform light distribution. Adopting the x-y-z-r stage to the light source enables a mask aligning function together with light intensity and exposure time controllers. The maximum intensity of 448 mW/cm2 has been measured and the light collimation has been achieved within 5°. The uniform light distribution was measured without and with light rotation. The rotating light source resulted in approximately 29% better than the no-rotation case. The LED source has been stable over 100 hours of operation. The test microstructures include 3 μm lines, high-aspect-ratio micropillars, and 2-mm tall SU-8 pillar array. The proposed system has great flexibility and versatility as a mask aligner system that can be used as both conventional and MEMS microfabrication.\",\"PeriodicalId\":6787,\"journal\":{\"name\":\"2020 IEEE 15th International Conference on Nano/Micro Engineered and Molecular System (NEMS)\",\"volume\":\"11 1\",\"pages\":\"73-76\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-09-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 15th International Conference on Nano/Micro Engineered and Molecular System (NEMS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NEMS50311.2020.9265607\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 15th International Conference on Nano/Micro Engineered and Molecular System (NEMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEMS50311.2020.9265607","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper presents a design, system setup, characterization, and microfabrication of high-intensity UV-LED microlithography. Since the high enough intensity of the UV light enables even a millimeter thick SU-8 photoresist process, an array of high-intensity UV-LEDs has been optimized as a light source of the microlithography system. A simple waveguide with a single optical lens has made light collimation without high attenuation of the light intensity while the rotation of the light source provides uniform light distribution. Adopting the x-y-z-r stage to the light source enables a mask aligning function together with light intensity and exposure time controllers. The maximum intensity of 448 mW/cm2 has been measured and the light collimation has been achieved within 5°. The uniform light distribution was measured without and with light rotation. The rotating light source resulted in approximately 29% better than the no-rotation case. The LED source has been stable over 100 hours of operation. The test microstructures include 3 μm lines, high-aspect-ratio micropillars, and 2-mm tall SU-8 pillar array. The proposed system has great flexibility and versatility as a mask aligner system that can be used as both conventional and MEMS microfabrication.