用于慢性神经植入物的聚对二甲苯C, SiO2和Si3N4包装的加速,反应老化试验

Yan Gong, Matthew Harris Brauer, Kristine Zheng, Wen Li
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引用次数: 1

摘要

在体液中植入神经修复装置的可靠包装是设备长期应用的一个长期挑战。本工作研究了聚对二甲苯C (PA)、SiO2和Si3N4封装在钨丝上的稳定性,采用加速反应老化试验,在三种溶液中:pH为7.4的磷酸盐缓冲盐水(PBS)、PBS+30 mM H2O2和PBS+150 mM H2O2。在67℃下研究了不同的涂层厚度组合和沉积方法。初步数据分析表明,针孔/缺陷、裂纹和界面分层是反应时效溶液中金属腐蚀退化的主要特征。在针尖开口的线材样品中,包层与金属界面失效是主要原因。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Accelerated, Reactive Aging Tests of Parylene C, SiO2, and Si3N4 Packages for Chronic Neural Implants
Reliable packaging for implantable neural prosthetic devices in body fluids is a long-standing challenge for device’s chronic applications. This work studied the stability of Parylene C (PA), SiO2, and Si3N4 packages on tungsten wires using accelerated, reactive aging tests in three solutions: pH 7.4 phosphate-buffered saline (PBS), PBS+30 mM H2O2, and PBS+150 mM H2O2. Different combinations of coating thicknesses and deposition methods were studied at 67 °C. Analysis of the preliminary data shows that the pinholes/defects, cracks, and interface delamination are the main attributes of metal erosion and degradation in reactive aging solutions. Failure at the interface of package and metal is the dominating factor in the wire samples with open tips.
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