氮化镓注入Be和F的光致发光研究

M. Reshchikov, O. Andrieiev, M. Vorobiov, Denis O. Demchenko, B. McEwen, Shadi Shahedipour-Sandvik
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引用次数: 1

摘要

在GaN样品中注入Be和F,并在不同条件下退火以激活BeGa受体。研究了光致发光光谱来识别缺陷。观测到极大值为3.38 eV的UVLBe带和极大值为2.15 eV的YLBe带。在600°C下,连续注入Be和F离子降低了氮空位(VN)的浓度,证明了与孤立的氮空位相关的绿色发光带的缺失。采用第一性原理计算来寻找植入后可能形成的缺陷的参数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Photoluminescence from GaN Implanted with Be and F
GaN samples are implanted with Be and F and annealed in different conditions to activate the BeGa acceptors. Photoluminescence spectra are studied to recognize the defects. The UVLBe band with a maximum at 3.38 eV and the YLBe band with a maximum at 2.15 eV are observed and associated with Be. The sequential implantation of Be and F ions into GaN at 600 °C reduces the concentration of nitrogen vacancies (VN), as evidenced by the lack of the green luminescence band associated with the isolated nitrogen vacancy. First‐principles calculations are employed to find parameters of defects that can form after implantation.
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