Jakob Helander, A. Ericsson, D. Sjoberg, M. Gustafsson, T. Martin, C. Larsson
{"title":"采用平面扫描技术对面板进行缺陷检测的60 GHz成像","authors":"Jakob Helander, A. Ericsson, D. Sjoberg, M. Gustafsson, T. Martin, C. Larsson","doi":"10.1109/APS.2016.7696220","DOIUrl":null,"url":null,"abstract":"This paper presents imaging results of measurements conducted at 60 GHz, using the planar rectangular near-field technique. Utilizing the stated techniques at higher frequencies enables detection of smaller defects, and allows for a small measurement set-up in a laboratory environment. An algorithm based on the Fast Fourier Transform (FFT) has been developed in order to process the data. The paper provides measurement results for an illustrative panel, which show clear detection of the distributed defects. The purpose of this work is to enable processing of recent data from measurements of industrial composite panels.","PeriodicalId":6496,"journal":{"name":"2016 IEEE International Symposium on Antennas and Propagation (APSURSI)","volume":"12 5 1","pages":"1025-1026"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"60 GHz imaging of panels for defect detection using planar scanning\",\"authors\":\"Jakob Helander, A. Ericsson, D. Sjoberg, M. Gustafsson, T. Martin, C. Larsson\",\"doi\":\"10.1109/APS.2016.7696220\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents imaging results of measurements conducted at 60 GHz, using the planar rectangular near-field technique. Utilizing the stated techniques at higher frequencies enables detection of smaller defects, and allows for a small measurement set-up in a laboratory environment. An algorithm based on the Fast Fourier Transform (FFT) has been developed in order to process the data. The paper provides measurement results for an illustrative panel, which show clear detection of the distributed defects. The purpose of this work is to enable processing of recent data from measurements of industrial composite panels.\",\"PeriodicalId\":6496,\"journal\":{\"name\":\"2016 IEEE International Symposium on Antennas and Propagation (APSURSI)\",\"volume\":\"12 5 1\",\"pages\":\"1025-1026\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Symposium on Antennas and Propagation (APSURSI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APS.2016.7696220\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Symposium on Antennas and Propagation (APSURSI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APS.2016.7696220","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
60 GHz imaging of panels for defect detection using planar scanning
This paper presents imaging results of measurements conducted at 60 GHz, using the planar rectangular near-field technique. Utilizing the stated techniques at higher frequencies enables detection of smaller defects, and allows for a small measurement set-up in a laboratory environment. An algorithm based on the Fast Fourier Transform (FFT) has been developed in order to process the data. The paper provides measurement results for an illustrative panel, which show clear detection of the distributed defects. The purpose of this work is to enable processing of recent data from measurements of industrial composite panels.
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