Ag和Ga含量对宽间隙(Ag,Cu)(in,Ga)Se2薄膜太阳能电池稳定性的影响研究

P. Pearson, J. Keller, L. Stolt, Charlotte Platzer Björkman
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引用次数: 0

摘要

在(Ag,Cu)(In,Ga)Se2材料体系中,随着时间的推移,经过干热退火和光浸泡后,薄膜太阳能电池的稳定性得到了评估,并探讨了Ag和Ga含量的作用。无Ag的Cu(In,Ga)Se2在退火和储存过程中相对稳定,而Cu(In,Ga)Se2则受到填充因子和载流子收集的影响。经过长时间退火后,高Ga (Ag,Cu)(In,Ga)Se2的载流子收集性能下降,使短路电流降低约12%。经过所有处理后,无Ga (Ag,Cu)InSe2损失高达三分之一的开路电压和四分之一的填充因子。所有样品在光浸泡后都遭受电压损失,其中无Ga器件损失高达50 mV,含Ga器件损失高达90 mV。Ag的掺入导致掺杂量显著减少,掺杂对处理的响应显著增加,(Ag,Cu)(in,Ga)Se2样品的耗尽宽度在所有处理后从≈0.1 μm扩展到超过1.0 μm,而Cu(in,Ga)Se2样品的变化幅度为≈0.1 ~ 0.3 μm。讨论了银含量、掺杂不稳定性和性能下降之间的关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigating the Role of Ag and Ga Content in the Stability of Wide‐Gap (Ag,Cu)(In,Ga)Se2 Thin‐Film Solar Cells
The stability of thin‐film solar cells spanning a wide range of compositions within the (Ag,Cu)(In,Ga)Se2 material system is evaluated over time, after dry‐heat annealing and after light soaking, and the role of Ag and Ga content is explored. Ag‐free CuInSe2 is relatively stable to annealing and storage, while Cu(In,Ga)Se2 suffers a degradation of fill factor and carrier collection. High‐Ga (Ag,Cu)(In,Ga)Se2 suffers degradation of carrier collection after prolonged annealing, reducing the short‐circuit current by ≈12%. Ga‐free (Ag,Cu)InSe2 loses up to a third of open‐circuit voltage and a quarter of fill factor after all treatments are applied. All samples suffer voltage losses after light soaking, with the Ga‐free devices losing up to 50 mV and those containing Ga losing up to 90 mV. Ag incorporation leads to a significant reduction in doping, and a significant increase in the response of doping to treatments, with the depletion width of (Ag,Cu)(In,Ga)Se2 samples expanding from ≈0.1 μm as‐grown to beyond 1.0 μm after all treatments, compared to the Cu(In,Ga)Se2 sample variation of ≈0.1–0.3 μm. Connections between Ag content, doping instability, and performance degradation are discussed.
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