基于软开关技术的电压转换率设计

IF 0.2 Q4 AREA STUDIES
Jialong Li, Yuying Wu, Dehong Xu
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引用次数: 0

摘要

宽带隙器件如SiC MOSFET和GaN器件具有高速和低开关损耗的明显优势。然而,它们具有较高的dv/dt,并可能导致较大的EMI噪声。本文研究了具有软开关功能的SiC MOSFET器件的电压转换率设计。分析了三相有源箝位零电压开关逆变器中功率器件的dv/dt。讨论了功率器件电压摆幅率与谐振参数的关系。然后提出了功率器件上dv/dt的设计。通过对基于10kw / 100khzsic的ZVS三相逆变器的仿真和实验验证了dv/dt设计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Voltage Slew Rate Design With Soft Switching Technique
Wide-band-gap devices such as SiC MOSFET and GaN devices have distinct advantages of high speed and lower switching loss. However, they have higher dv/dt and may cause larger EMI noise. In this paper, design of voltage slew rate on SiC MOSFET devices with soft-switching is investigated. The dv/dt of power devices in the three-phase active-clamped zero voltage switching (ZVS) inverter is analyzed. The voltage slew rate of power devices vs. resonant parameters is discussed. Then the design of dv/dt on power devices are proposed. The dv/dt design has been verified through both the simulation and the experiment on the 10 kW/100kHzSiC-based ZVS three phase inverter.
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CiteScore
1.20
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