多相时间-数字转换器差分游标环振荡器

A. Annagrebah, E. Bechetoille, I. Laktineh, H. Chanal, P. Russo, H. Mathez
{"title":"多相时间-数字转换器差分游标环振荡器","authors":"A. Annagrebah, E. Bechetoille, I. Laktineh, H. Chanal, P. Russo, H. Mathez","doi":"10.1109/ISVLSI.2019.00069","DOIUrl":null,"url":null,"abstract":"is paper reports the development of an adjustable, Time-to-Digital Converter (TDC) based on two vernier Ring Oscillators (RO). The TDC aims to measure timing in Resistive Plate Chamber (RPC) detector for CMS experiment. Considering previous designs, the contribution from power supply noise and intrinsic transistor noise had been minimizing with differential stages and proper transistor sizing. In order to reduce the dead time inherent to Vernier TDC architecture, as many Phase Detector (PD) as possible had been implemented. Such functionality permits to choose whether reducing the dead time or measuring redundantly the start-stop time difference for an improved resolution. The 81-PD Matrix is the originality of the design. Indeed, the information of the start-stop time is present at each inverter output with a predictable offset in term of time. The inverter architecture introduces a constant delay at each stage of the chain with phase inversion. By recording the counter when a phase detection occurs at each inverter output permitted to revert back to the start-stop time. The prototype TDC fabricated in a 130-nm technology consumes 8.5 mW power under 1.2-V supply. The measurement of this chip shown a timing accuracy of 5.48 ps at a timing resolution of 8 ps for the first data allowed by the first phase detection","PeriodicalId":6703,"journal":{"name":"2019 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","volume":"22 1","pages":"344-347"},"PeriodicalIF":0.0000,"publicationDate":"2019-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Multi-phase Time-to-Digital Converter Differential Vernier Ring Oscillato\",\"authors\":\"A. Annagrebah, E. Bechetoille, I. Laktineh, H. Chanal, P. Russo, H. Mathez\",\"doi\":\"10.1109/ISVLSI.2019.00069\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"is paper reports the development of an adjustable, Time-to-Digital Converter (TDC) based on two vernier Ring Oscillators (RO). The TDC aims to measure timing in Resistive Plate Chamber (RPC) detector for CMS experiment. Considering previous designs, the contribution from power supply noise and intrinsic transistor noise had been minimizing with differential stages and proper transistor sizing. In order to reduce the dead time inherent to Vernier TDC architecture, as many Phase Detector (PD) as possible had been implemented. Such functionality permits to choose whether reducing the dead time or measuring redundantly the start-stop time difference for an improved resolution. The 81-PD Matrix is the originality of the design. Indeed, the information of the start-stop time is present at each inverter output with a predictable offset in term of time. The inverter architecture introduces a constant delay at each stage of the chain with phase inversion. By recording the counter when a phase detection occurs at each inverter output permitted to revert back to the start-stop time. The prototype TDC fabricated in a 130-nm technology consumes 8.5 mW power under 1.2-V supply. The measurement of this chip shown a timing accuracy of 5.48 ps at a timing resolution of 8 ps for the first data allowed by the first phase detection\",\"PeriodicalId\":6703,\"journal\":{\"name\":\"2019 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)\",\"volume\":\"22 1\",\"pages\":\"344-347\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISVLSI.2019.00069\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISVLSI.2019.00069","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

本文报道了一种基于两个游标环振荡器的可调时间-数字转换器(TDC)的研制。TDC旨在测量CMS实验中电阻板室(RPC)探测器的定时。考虑到以前的设计,通过不同的级和适当的晶体管尺寸,电源噪声和晶体管固有噪声的贡献已经最小化。为了减少游标TDC结构固有的死区时间,人们设计了尽可能多的鉴相器(PD)。这样的功能允许选择是否减少死区时间或冗余测量启动停止时间差,以提高分辨率。81-PD矩阵是设计的独创性。实际上,启停时间的信息存在于每个逆变器的输出,在时间方面具有可预测的偏移。逆变器结构在链的每个阶段引入恒定的相位反转延迟。通过记录计数器,当相位检测发生在每个逆变器输出时,允许恢复到启停时间。采用130纳米技术制造的原型TDC在1.2 v电源下功耗为8.5 mW。该芯片的测量显示,第一相位检测允许的第一个数据的定时分辨率为8 ps,定时精度为5.48 ps
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Multi-phase Time-to-Digital Converter Differential Vernier Ring Oscillato
is paper reports the development of an adjustable, Time-to-Digital Converter (TDC) based on two vernier Ring Oscillators (RO). The TDC aims to measure timing in Resistive Plate Chamber (RPC) detector for CMS experiment. Considering previous designs, the contribution from power supply noise and intrinsic transistor noise had been minimizing with differential stages and proper transistor sizing. In order to reduce the dead time inherent to Vernier TDC architecture, as many Phase Detector (PD) as possible had been implemented. Such functionality permits to choose whether reducing the dead time or measuring redundantly the start-stop time difference for an improved resolution. The 81-PD Matrix is the originality of the design. Indeed, the information of the start-stop time is present at each inverter output with a predictable offset in term of time. The inverter architecture introduces a constant delay at each stage of the chain with phase inversion. By recording the counter when a phase detection occurs at each inverter output permitted to revert back to the start-stop time. The prototype TDC fabricated in a 130-nm technology consumes 8.5 mW power under 1.2-V supply. The measurement of this chip shown a timing accuracy of 5.48 ps at a timing resolution of 8 ps for the first data allowed by the first phase detection
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信