高温应用中使用E/ d模式AlGaN/GaN mishemt的单片比较器

Weisheng Wang, Ang Li, Miao Cui, H. Wen, Wen Liu
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引用次数: 1

摘要

将增强(E-)和耗尽(D-)模式的AlGaN/GaN金属绝缘体半导体高电子迁移率晶体管(MIS-HEMT)单片集成在智能集成电路(IC)平台上,形成基本电路模块-比较器。通过改变差分输入对的模态类型,比较器电路在不同的电压范围内工作。E/D模式MIS-HEMT比较器在室温和高达200°C的高温下的转移特性。结果表明,不同E/D工作模式的比较器对应不同的工作范围,分别实现了−8到0 V和0到5 V的逻辑转换。这些比较器的结果证明了结构的可行性和灵活性,并为全氮化镓电源平台的单片集成提供了额外的选择。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Monolithic Comparators using E/D-mode AlGaN/GaN MIS-HEMTs for High-temperature Applications
AlGaN/GaN metal-insulator-semiconductor high-electron-mobility-transistors (MIS-HEMT) in enhancement (E-) and depletion (D-) modes are monolithically integrated on an intelligent integrated circuit (IC) platform to form the basic circuit modules-the comparators. The comparator circuit operates over different voltage ranges by varying the DIE-mode type of the differential input pair. The transfer characteristics of E/D mode MIS-HEMT comparators are shown at room temperature and high temperatures up to 200°C. The results indicate that the proposed comparators with different E/D operating modes correspond to different operating ranges, implementing logic conversion for −8 to 0 V and 0 to 5 V, respectively. The results of these comparators demonstrate the feasibility and flexibility of the structure and provide additional options for monolithic integration for the all-GaN power platform.
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