用包层最小化圆柱微谐振器的损耗:实验和数值研究

LEOS 2001. 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society (Cat. No.01CH37242) Pub Date : 2001-11-15 DOI:10.1109/LEOS.2001.968949

D. Klunder, F. Tan, T. van der Veen, H. Bulthuis, G. Sengo, H. Hoekstra, A. Driessen

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引用次数: 1

摘要

本文研究了包层对Si/sub - 3/N/sub - 4/ SiO/sub - 2圆柱形微谐振器(MR)损耗的影响。实验结果与详细的数值模拟结果相吻合，并给出了利用包层存在的器件实例。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Minimized losses in a cylindrical microresonator by use of a cladding: experimental and numerical study

We present an experimental study of the influence of a cladding on the losses in a Si/sub 3/N/sub 4/ on SiO/sub 2/ cylindrical microresonator (MR). The experimental results are corroborated with detailed numerical simulations and examples of devices which exploit the presence of a cladding are given.

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LEOS 2001. 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society (Cat. No.01CH37242)

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