A. Ioisher, E. Aleinicov, É. Badinter, N. Leporda, I. Tiginyanu, V. Ursaki
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引用次数: 0
摘要
我们研究了揭示半导体丝状微纳米结构(FMS u FNS)中磁浓度,特别是电磁复合(GMR)效应的可能性。这些结构代表了相互隔离的玻璃外壳中的微纳米线,芯由半导体材料制成。不同的载流子表面复合速率在芯的截然相反的表面实现。这种差异保证了放置在横向磁场中的FMS和FNS片段上出现GMR效应的条件,从而导致样品电阻与磁场强度成比例的变化。
On the possibility to realize the magneto-concentration effect in filiform micro- and nano-structures
We investigate the possibility of revealing the magneto-concentration, particularly the galvano-magneto-recombination (GMR) effect in semiconductor filiform micro- and nano-strurcures (FMS u FNS). These structures represent isolated from each other micro- and nano-wires in glass envelope with the core from a semiconductor material. Different rates of charge carrier surface recombination rates are realized at diametrically opposed surfaces of cores. This difference assure conditions for the emergence of the GMR effect on segments of such FMS and FNS placed in a transversal magnetic field which leads to the change of the sample resistance proportionally to the intensity of the magnetic field.