一种新型纳米复合薄膜型倒装芯片技术的设计优化与分析

Hsien-Chie Cheng, Kun-Yu Hsieh
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引用次数: 0

摘要

本文旨在开发一种新型纳米复合倒装芯片(FC)技术的有效设计优化方案,该技术将银纳米线/聚合物纳米复合膜与不导电浆料(NCP)技术集成在一起。优化问题的目标是通过材料性能、工艺参数和几何数据的选择,实现新型FC技术在NCP键合过程中最优的工艺诱导热-力学行为。过程引起的热力学行为使用过程相关的模拟方法进行评估,该方法集成了瞬态热和非线性接触有限元分析以及“死亡-出生”网格方案。通过实验验证了过程相关有限元仿真方法的有效性。为了证明当前设计优化方法的有效性,执行了与FC技术相关的几个设计问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design optimization and analysis of a novel nanocomposite-film typed flip chip technology
This paper aims at developing an effective scheme for design optimization of a novel nanocomposite-typed flip chip (FC) technology, constructed by integrating an Ag-nanowire/polymer nanocomposite film together with a nonconductive paste (NCP) technology. The objective of the optimization problem is to achieve the optimal process-induced thermal-mechanical behaviors of the novel FC technology during the NCP bonding process through the selection of material properties, process parameters and geometry data. The process-induced thermal-mechanical behaviors are evaluated using a process-dependent simulation methodology that integrates both transient thermal and nonlinear contact FE analyses and a “death-birth” meshing scheme. The validity of the process-dependent FE simulation methodology is also confirmed through experiment. To demonstrate the effectiveness of the present design optimization approach, several design problems associated with the FC technology are performed.
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