Na和K对超声喷涂Cu2ZnSnS4薄膜性能的影响

M. Sekkati, M. Taibi, G. Schmerber, E. Benamar, M. Regragui, F. C. E. Moursli, C. Leuvrey, Z. Edfouf, Z. Sekkat, A. Dinia, A. Slaoui, M. Abd-lefdil
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引用次数: 2

摘要

通过超声波喷涂技术将CZTS薄膜沉积在玻璃和mo涂层玻璃衬底上,然后在500°C氩气气氛下进行1 h的硫化。我们研究了碱的加入对Cu2ZnSnS4薄膜性能的影响。x射线衍射和拉曼光谱证明了CZTS具有112沿优先取向的kesterite结构。用能量色散光谱法测定未掺杂和碱掺杂的CZTS的Cu/(Zn+Sn)和(Zn/Sn)比值受碱掺杂的影响。碱掺杂后,沉积在玻璃基板上的CZTS薄膜的电阻率从未掺杂CZTS的9.2 10−1 Ω·cm降低到Na含量为15%时的1.8 10−1 Ω·cm和K含量为15%时的4.2 10−1 Ω·cm。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The Impact of Na and K on Properties of Cu2ZnSnS4 Thin Films Prepared by Ultrasonic Spray Technique
CZTS thin films are deposited onto glass and Mo-coated glass substrates by ultrasonic spray technique, followed by a sulfurization under argon atmosphere at 500 °C during 1 h. We have investigated how the addition of the alkali can influence Cu2ZnSnS4 thin films properties. X-ray diffraction and Raman spectroscopy proved that CZTS has the kesterite structure with a preferential orientation along 112. The values of Cu/(Zn+Sn) and (Zn/Sn) ratios, determined by energy dispersive spectroscopy, for undoped CZTS and alkali-doped CZTS are observed to be affected by the alkali doping. The electrical resistivity, for CZTS films deposited on glass substrates, decreased after alkali doping from 9.2 10−1 Ω · cm for undoped CZTS to reach 1.8 10−1 and 4.2 10−1 Ω · cm for 15% content of Na and K, respectively.
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