Jianguo Yang, Qingting Ding, Tiancheng Gong, Q. Luo, X. Xue, Zhaomeng Gao, Haoran Yu, Jie Yu, Xiaoxin Xu, Peng Yuan, Xiaoyan Li, L. Tai, S. Chung, H. Lv, Ming Liu
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Robust True Random Number Generator Using Stochastic Short-term Recovery of Charge Trapping FinFET for Advanced Hardware Security
In this work, we demonstrated a novel true random number generator (TRNG) utilizing stochastic short-term recovery of Charge- Trapping (CT) FinFET devices. The true random bits were generated by measuring the recovery time of CT-FinFET with a digital counter by a time-to-digital count converter (TDCC) unit. The resulting CT - TRNG circuit shows great immunity against a power noise of up to 600m V in amplitude and up to 1.5G Hz in frequency across a wide range of temperatures (-20 to 85°C). It passed all NIST 800–22 and NIST 800-90B randomness tests. We have shown this novel CT - TRNG to be the most promising high-reliability hardware security solution to date.
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