{"title":"一种改进的基于SPICE的超低导通电阻非闪回电视器件行为模型","authors":"Yanlin Nie, Qiupei Huang, Jizhi Liu, Zhiwei Liu","doi":"10.1109/ICSICT49897.2020.9278131","DOIUrl":null,"url":null,"abstract":"TVS devices have been widely used in portable devices to improve the ESD robustness in system level ESD test. TVS model with good accuracy is desirable in the system level ESD simulation. This paper presents an improved SPICE based behavior model for TVS with ultra-low turn-on resistance. Validation have been down for both quasi-static behavior and transient behavior.","PeriodicalId":6727,"journal":{"name":"2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)","volume":"47 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An Improved SPICE Based Behavior Model for Non-Snapback TVS Devices with Ultra-low Turn-on Resistance\",\"authors\":\"Yanlin Nie, Qiupei Huang, Jizhi Liu, Zhiwei Liu\",\"doi\":\"10.1109/ICSICT49897.2020.9278131\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"TVS devices have been widely used in portable devices to improve the ESD robustness in system level ESD test. TVS model with good accuracy is desirable in the system level ESD simulation. This paper presents an improved SPICE based behavior model for TVS with ultra-low turn-on resistance. Validation have been down for both quasi-static behavior and transient behavior.\",\"PeriodicalId\":6727,\"journal\":{\"name\":\"2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)\",\"volume\":\"47 1\",\"pages\":\"1-3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-11-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSICT49897.2020.9278131\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSICT49897.2020.9278131","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Improved SPICE Based Behavior Model for Non-Snapback TVS Devices with Ultra-low Turn-on Resistance
TVS devices have been widely used in portable devices to improve the ESD robustness in system level ESD test. TVS model with good accuracy is desirable in the system level ESD simulation. This paper presents an improved SPICE based behavior model for TVS with ultra-low turn-on resistance. Validation have been down for both quasi-static behavior and transient behavior.