基于原子通量散度的信号线电迁移可靠性评估电流转换方案

2021 IEEE International Interconnect Technology Conference (IITC) Pub Date : 2014-05-20 DOI:10.1109/IITC.2014.6831886

Zhong Guan, M. Marek-Sadowska, S. Nassif, Baozhen Li

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引用次数: 17

摘要

本文对信号线的电迁移可靠性进行了研究。基于最大原子通量散度的一致性，提出了脉冲直流电到稳定直流电电流转换的一般模型。考虑了高频电流的长引线和短引线。计算的有效稳定直流电与实测结果吻合。我们的转换方案也适用于具有复杂电流路径的信号线。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Atomic flux divergence based current conversion scheme for signal line electromigration reliability assessment

In this paper, we study electromigration (EM) reliability of signal lines. We propose a general model for current conversion from pulsed DC to steady DC based on the consistency of maximal atomic flux divergence. Both long and short lead lines with high frequency current are considered. The calculated effective steady DC agrees with the measured results. Our conversion scheme can be applied also to signal lines with complex current paths.

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2021 IEEE International Interconnect Technology Conference (IITC)

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