R. Joshi, S. Kowalczyk, Y. Chan, W. Huott, S.C. Wilson, G. J. Scharff
{"title":"采用1.5 V、0.18 /spl mu/m CMOS块体技术,实现2 GHz周期、430 ps访问时间、34 Kb L1目录SRAM","authors":"R. Joshi, S. Kowalczyk, Y. Chan, W. Huott, S.C. Wilson, G. J. Scharff","doi":"10.1109/VLSIC.2000.852897","DOIUrl":null,"url":null,"abstract":"This paper describes a high speed L1 directory (34 Kb) with read access time below 430 ps and a cycle of 2 GHz in 1.5 V, 0.18 /spl mu/m CMOS bulk technology. The key features of this high performance dynamic design are fast static input/output interface with the provision of converting internal signals from static to dynamic and then back to static at the output, L1/L2 latches at the input, modular building blocks, pseudo-static circuits, robust timing plan and capability for extensive test pattern coverage and access time evaluation using a programmable \"Array-Built-In-Self-Test\" (ABIST).","PeriodicalId":6361,"journal":{"name":"2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)","volume":"1993 1","pages":"222-225"},"PeriodicalIF":0.0000,"publicationDate":"2000-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"A 2 GHz cycle, 430 ps access time 34 Kb L1 directory SRAM in 1.5 V, 0.18 /spl mu/m CMOS bulk technology\",\"authors\":\"R. Joshi, S. Kowalczyk, Y. Chan, W. Huott, S.C. Wilson, G. J. Scharff\",\"doi\":\"10.1109/VLSIC.2000.852897\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a high speed L1 directory (34 Kb) with read access time below 430 ps and a cycle of 2 GHz in 1.5 V, 0.18 /spl mu/m CMOS bulk technology. The key features of this high performance dynamic design are fast static input/output interface with the provision of converting internal signals from static to dynamic and then back to static at the output, L1/L2 latches at the input, modular building blocks, pseudo-static circuits, robust timing plan and capability for extensive test pattern coverage and access time evaluation using a programmable \\\"Array-Built-In-Self-Test\\\" (ABIST).\",\"PeriodicalId\":6361,\"journal\":{\"name\":\"2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)\",\"volume\":\"1993 1\",\"pages\":\"222-225\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-06-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2000.852897\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2000.852897","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 2 GHz cycle, 430 ps access time 34 Kb L1 directory SRAM in 1.5 V, 0.18 /spl mu/m CMOS bulk technology
This paper describes a high speed L1 directory (34 Kb) with read access time below 430 ps and a cycle of 2 GHz in 1.5 V, 0.18 /spl mu/m CMOS bulk technology. The key features of this high performance dynamic design are fast static input/output interface with the provision of converting internal signals from static to dynamic and then back to static at the output, L1/L2 latches at the input, modular building blocks, pseudo-static circuits, robust timing plan and capability for extensive test pattern coverage and access time evaluation using a programmable "Array-Built-In-Self-Test" (ABIST).