高纵横比内部特征三维测量技术综述

T. Hovell, J. Petzing, Weng Guo, Connor Gill, L. Justham, N. Lohse, P. Kinnell
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引用次数: 0

摘要

高纵横比微尺度特征的无损测量,特别是那些具有微孔等内部几何形状的特征,仍然是一个具有挑战性的测量问题,由于这类结构对复杂性和公差的要求越来越高,其难度也越来越大。此外,越来越多地使用功能性表面纹理来改善传热和润湿性等特性。因此,能够为这些特征提供尺寸形式和表面光洁度的测量技术引起了人们的强烈兴趣。这篇综述探讨了与高纵横比结构兼容的最先进的检测方法,以及它们基于已识别的高纵横比结构类型提取三维表面数据的适用性。在这里,介绍了这些测量技术的能力、限制、挑战和未来的实际实施和接受需求。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Measurement Techniques for Three-Dimensional Metrology of High Aspect Ratio Internal Features—A Review
Non-destructive measurements of high aspect ratio microscale features, especially those with internal geometries such as micro-holes, remain a challenging metrology problem that is increasing in difficulty due to the increasing requirement for more complexity and higher tolerances in such structures. Additionally, there is a growing use of functional surface texturing for improving characteristics such as heat transfer and wettability. As a result, measurement techniques capable of providing dimensional form and surface finish for these features are of intense interest. This review explores the state-of-the-art inspection methodologies compatible with high-aspect-ratio structures and their suitability for extracting three-dimensional surface data based on identified high-aspect ratio structure types. Here, the abilities, limitations, challenges, and future requirements for the practical implementation and acceptance of these measurement techniques are presented.
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