高吸收和高寿命的锥形硅微线阵列作为薄膜晶体硅太阳能电池的替代品

S. Yalamanchili, Hal S. Emmer, N. Lewis, H. Atwater
{"title":"高吸收和高寿命的锥形硅微线阵列作为薄膜晶体硅太阳能电池的替代品","authors":"S. Yalamanchili, Hal S. Emmer, N. Lewis, H. Atwater","doi":"10.1109/PVSC.2016.7750213","DOIUrl":null,"url":null,"abstract":"We report cryogenic inductively coupled plasma reactive ion etching (ICPRIE) etched tapered silicon microwires are ideal light trapping structures with extremely low (1.08% between 400 nm-1100 nm under normal incidence) reflectivity. We show that these tapered microwire arrays absorb 90.12% of incident light under normal incidence in an effectively 20 μm thick silicon when embedded in a polymer and peeled off the substrate, making them an attractive alternative for achieving high efficiency in thin film crystalline silicon solar cells. We show that microwave photoconductivity decay measurements as a simple quick way to measure carrier lifetimes in etched microwires under various liquid surface passivation techniques to estimate surface recombination velocities. The etched structures demonstrate >1 μs lifetimes.","PeriodicalId":6524,"journal":{"name":"2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)","volume":"24 1","pages":"2999-3003"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Highly absorbing and high lifetime tapered silicon microwire arrays as an alternative for thin film crystalline silicon solar cells\",\"authors\":\"S. Yalamanchili, Hal S. Emmer, N. Lewis, H. Atwater\",\"doi\":\"10.1109/PVSC.2016.7750213\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report cryogenic inductively coupled plasma reactive ion etching (ICPRIE) etched tapered silicon microwires are ideal light trapping structures with extremely low (1.08% between 400 nm-1100 nm under normal incidence) reflectivity. We show that these tapered microwire arrays absorb 90.12% of incident light under normal incidence in an effectively 20 μm thick silicon when embedded in a polymer and peeled off the substrate, making them an attractive alternative for achieving high efficiency in thin film crystalline silicon solar cells. We show that microwave photoconductivity decay measurements as a simple quick way to measure carrier lifetimes in etched microwires under various liquid surface passivation techniques to estimate surface recombination velocities. The etched structures demonstrate >1 μs lifetimes.\",\"PeriodicalId\":6524,\"journal\":{\"name\":\"2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)\",\"volume\":\"24 1\",\"pages\":\"2999-3003\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-06-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PVSC.2016.7750213\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2016.7750213","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

我们报道了低温电感耦合等离子体反应离子蚀刻(ICPRIE)蚀刻的圆锥硅微线是理想的光捕获结构,具有极低的反射率(在正常入射下,400 nm-1100 nm之间为1.08%)。我们的研究表明,当嵌入聚合物并剥离衬底时,这些锥形微线阵列在有效的20 μm厚硅中吸收正常入射光的90.12%,使其成为薄膜晶体硅太阳能电池中实现高效率的有吸引力的替代方案。我们表明,微波光导衰减测量是一种简单快速的方法,可以测量蚀刻微导线在各种液体表面钝化技术下的载流子寿命,以估计表面复合速度。蚀刻结构的寿命为bb0.1 μs。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Highly absorbing and high lifetime tapered silicon microwire arrays as an alternative for thin film crystalline silicon solar cells
We report cryogenic inductively coupled plasma reactive ion etching (ICPRIE) etched tapered silicon microwires are ideal light trapping structures with extremely low (1.08% between 400 nm-1100 nm under normal incidence) reflectivity. We show that these tapered microwire arrays absorb 90.12% of incident light under normal incidence in an effectively 20 μm thick silicon when embedded in a polymer and peeled off the substrate, making them an attractive alternative for achieving high efficiency in thin film crystalline silicon solar cells. We show that microwave photoconductivity decay measurements as a simple quick way to measure carrier lifetimes in etched microwires under various liquid surface passivation techniques to estimate surface recombination velocities. The etched structures demonstrate >1 μs lifetimes.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信