T. Shinohe, A. Yahata, M. Atsuta, Y. Minami, N. Ohashi
{"title":"高频,超高di/dt磁力管的设计标准","authors":"T. Shinohe, A. Yahata, M. Atsuta, Y. Minami, N. Ohashi","doi":"10.1109/IEDM.1991.235478","DOIUrl":null,"url":null,"abstract":"2500-V MOS assisted gate triggered thyristors (MAGTs) have been proposed as promising devices for future pulsed power applications. It was successfully demonstrated that the device has extremely high turn-on capability, comparable to thyratrons. The MAGT high-frequency operation design criteria are shown here. The photoluminescence (PL) decay method was used to measure the actual carrier lifetime in MAGT devices. It reveals that an electron carrier lifetime more than half of the operating pulse width is sufficient to minimize the turn-on loss. This means that the pause period can be reduced while still retaining small turn-on loss. A simple model is presented to interpret the turn-on loss dependence on the N-base width. With the optimized devices, 5-kHz operation was successfully demonstrated.<<ETX>>","PeriodicalId":13885,"journal":{"name":"International Electron Devices Meeting 1991 [Technical Digest]","volume":"83 1","pages":"153-156"},"PeriodicalIF":0.0000,"publicationDate":"1991-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Design criteria for high frequency, ultra high di/dt MAGTs\",\"authors\":\"T. Shinohe, A. Yahata, M. Atsuta, Y. Minami, N. Ohashi\",\"doi\":\"10.1109/IEDM.1991.235478\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"2500-V MOS assisted gate triggered thyristors (MAGTs) have been proposed as promising devices for future pulsed power applications. It was successfully demonstrated that the device has extremely high turn-on capability, comparable to thyratrons. The MAGT high-frequency operation design criteria are shown here. The photoluminescence (PL) decay method was used to measure the actual carrier lifetime in MAGT devices. It reveals that an electron carrier lifetime more than half of the operating pulse width is sufficient to minimize the turn-on loss. This means that the pause period can be reduced while still retaining small turn-on loss. A simple model is presented to interpret the turn-on loss dependence on the N-base width. With the optimized devices, 5-kHz operation was successfully demonstrated.<<ETX>>\",\"PeriodicalId\":13885,\"journal\":{\"name\":\"International Electron Devices Meeting 1991 [Technical Digest]\",\"volume\":\"83 1\",\"pages\":\"153-156\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Electron Devices Meeting 1991 [Technical Digest]\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1991.235478\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Electron Devices Meeting 1991 [Technical Digest]","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1991.235478","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
摘要
2500 v MOS辅助门触发晶闸管(MAGTs)被认为是未来脉冲功率应用的有前途的器件。成功地证明了该器件具有极高的导通能力,可与闸流管相媲美。MAGT高频操作设计准则如图所示。采用光致发光(PL)衰减法测量了磁致发光器件中载流子的实际寿命。结果表明,电子载流子寿命大于工作脉冲宽度的一半就足以使导通损耗最小化。这意味着暂停时间可以减少,同时仍然保持小的开启损失。提出了一个简单的模型来解释导通损耗与n基宽度的关系。利用优化后的器件,成功地实现了5khz的工作。
Design criteria for high frequency, ultra high di/dt MAGTs
2500-V MOS assisted gate triggered thyristors (MAGTs) have been proposed as promising devices for future pulsed power applications. It was successfully demonstrated that the device has extremely high turn-on capability, comparable to thyratrons. The MAGT high-frequency operation design criteria are shown here. The photoluminescence (PL) decay method was used to measure the actual carrier lifetime in MAGT devices. It reveals that an electron carrier lifetime more than half of the operating pulse width is sufficient to minimize the turn-on loss. This means that the pause period can be reduced while still retaining small turn-on loss. A simple model is presented to interpret the turn-on loss dependence on the N-base width. With the optimized devices, 5-kHz operation was successfully demonstrated.<>