铁电PZT薄膜的温度依赖性疲劳

ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics Pub Date : 1996-08-18 DOI:10.1109/ISAF.1996.602790

E. N. Paton, Said Mansour, A. Bement

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引用次数: 2

摘要

测定了Pb(Zr/sub .60/Ti/sub .40/)O/sub . 3/组成的锆钛酸铅电容器在不同温度下的电疲劳率。结果表明，温度升高导致疲劳曲线的对数衰减速率增加。我们区分疲劳过程中的两个热相关阶段;每个都绘制成单独的阿伦尼乌斯关系。第一级的实验测量活化能为0.22 eV，第二级的测量活化能为0.042 eV。由于在转换逆转过程中发生的相互作用的复杂性，这些活化能的物理基础尚未确定。即使如此，测量值给出了缺陷类型和每个阶段中负责的机制的一些指示。

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Temperature dependent fatigue in ferroelectric PZT thin films

The rate of electrical fatigue at different temperatures was measured for lead zirconate titanate capacitors with the composition Pb(Zr/sub .60/Ti/sub .40/)O/sub 3/. Results showed that a temperature rise contributes to an increasing rate of logarithmic decay in the fatigue profile. We distinguish two thermally dependent stages during fatigue; each plotted as separate Arrhenius relationships. The first stage has an experimentally measured activation energy of 0.22 eV while the second stage has a measured value of 0.042 eV. The physical basis for these activation energies has not been identified due to the complexity of interactions occurring during the switching reversals. Even so, the measured values give some indication of the types of defects and the mechanisms responsible in each stage.

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来源期刊

ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics

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