X射线荧光全息法分析Cu(In,Ga)Se 2的局部结构

S. Shirakata, Yuma Kitamura, N. Happo, S. Hosokawa, K. Hayashi
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引用次数: 1

摘要

采用逆模对Cu(In,Ga)Se2单晶进行了x射线荧光全息(XFH)研究。入射x射线的能量为9.2 ~ 13.2 keV。构建了cu - k - α x射线荧光全息图,并利用Barton算法重建了原子图像。研究了Cu或Ga荧光x射线对CuIn0.2Ga0.8Se2重建原子像的依赖性。比较了CuIn0.2Ga0.8Se2与CuIn0.8Ga0.2Se2的原子图像。从合金成分的角度讨论了阳离子(Cu, Ga, In)面和阴离子(Se)面重建的原子像。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Local structure analysis of Cu(In,Ga)Se 2 by X‐ray fluorescence holography
X-ray Fluorescence Holography (XFH) study of Cu(In,Ga)Se2 single crystals has been performed using an inverse mode. Energies of incident X-ray are from 9.2 to 13.2 keV. The Cu-Kα X-ray fluorescence hologram has been constructed, and atomic images were reconstructed using Barton's algorithm. Dependence of fluorescent X-ray, either Cu or Ga, on the reconstructed atomic images of CuIn0.2Ga0.8Se2 was examined. The atomic image of CuIn0.2Ga0.8Se2 was compared with that of CuIn0.8Ga0.2Se2. The reconstructed atomic images of the cation (Cu, Ga, and In) plane and that of the anion (Se) plane are discussed in terms of the alloy composition.
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