杂质和晶粒尺寸对T3铜焊接性能的影响

Xueke Wang, S. Bao, Yongda Hu, Qiang Li, Libo Ai
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引用次数: 0

摘要

采用x射线荧光分析、毫欧姆计和x射线能量色散光谱仪对铜线的杂质和电阻进行了研究。通过抛光和腐蚀试验,扫描电镜观察到不同晶粒尺寸。杂质会影响铜线的硬度和导电性。晶粒尺寸也影响硬度和塑性。因此,杂质和晶粒尺寸的不同导致了焊接性能的不同。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effects of impurities and grain size on welding performance of T3 copper
X-ray fluorescence analyze, the milliohm meter and X-ray energy dispersive spectrometer were used to investigate the impurities and electric resistance of the copper wire. By the polishing and corrosion testing, the different grain sizes were observed by scanning electron microscopy. The impurities can effect on the hardness and electrical conductivity of the copper wire. The grain size also affects the hardness and plasticity. Consequently, the difference in impurities and grain sizes lead to the different welding performance.
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