S. K. Bernard, O. Mansilla, L. Pearce, W. H. Newman, E. Thomson
{"title":"用于空间应用的宽带隙元件","authors":"S. K. Bernard, O. Mansilla, L. Pearce, W. H. Newman, E. Thomson","doi":"10.1109/ESPC.2019.8932059","DOIUrl":null,"url":null,"abstract":"This paper will go over the benefits and advantages of GaN over traditional silicon and summarize the Single Event Effects (SEE) testing that was done for Renesas' GaN FETs. This paper will also discuss the results of the SEE testing and what they mean with respect to a typical Geosynchronous Orbit (GEO) mission.","PeriodicalId":6734,"journal":{"name":"2019 European Space Power Conference (ESPC)","volume":"237 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Wide Bandgap Components for Space Applications\",\"authors\":\"S. K. Bernard, O. Mansilla, L. Pearce, W. H. Newman, E. Thomson\",\"doi\":\"10.1109/ESPC.2019.8932059\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper will go over the benefits and advantages of GaN over traditional silicon and summarize the Single Event Effects (SEE) testing that was done for Renesas' GaN FETs. This paper will also discuss the results of the SEE testing and what they mean with respect to a typical Geosynchronous Orbit (GEO) mission.\",\"PeriodicalId\":6734,\"journal\":{\"name\":\"2019 European Space Power Conference (ESPC)\",\"volume\":\"237 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 European Space Power Conference (ESPC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESPC.2019.8932059\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 European Space Power Conference (ESPC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESPC.2019.8932059","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper will go over the benefits and advantages of GaN over traditional silicon and summarize the Single Event Effects (SEE) testing that was done for Renesas' GaN FETs. This paper will also discuss the results of the SEE testing and what they mean with respect to a typical Geosynchronous Orbit (GEO) mission.