{"title":"前端镀银对晶体硅光伏组件高温高湿测试的影响","authors":"T. Semba, Takeo Shimada, T. Fujita","doi":"10.1109/PVSC40753.2019.8981218","DOIUrl":null,"url":null,"abstract":"Regarding the crystalline Silicon Photovoltaic module in which the corrosion of the front-side metallization occurred form near the bus bars in the high temperature high humidity test, the state of the finger metallization after the test was observed. Corrosion of the glass of the metallization was confirmed as in the previous report. In addition, there was a gap between the bulk Ag and the glass layer. This gap can cause an increase in series resistance between the emitter and the finger bars. Sn was also detected from a part of the corroded metallization surface.","PeriodicalId":6749,"journal":{"name":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","volume":"7 1","pages":"1525-1528"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Influence of Front-Side Ag Metallization on High Temperature and High Humidity Test of Crystalline Silicon PV Module\",\"authors\":\"T. Semba, Takeo Shimada, T. Fujita\",\"doi\":\"10.1109/PVSC40753.2019.8981218\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Regarding the crystalline Silicon Photovoltaic module in which the corrosion of the front-side metallization occurred form near the bus bars in the high temperature high humidity test, the state of the finger metallization after the test was observed. Corrosion of the glass of the metallization was confirmed as in the previous report. In addition, there was a gap between the bulk Ag and the glass layer. This gap can cause an increase in series resistance between the emitter and the finger bars. Sn was also detected from a part of the corroded metallization surface.\",\"PeriodicalId\":6749,\"journal\":{\"name\":\"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)\",\"volume\":\"7 1\",\"pages\":\"1525-1528\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PVSC40753.2019.8981218\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC40753.2019.8981218","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Influence of Front-Side Ag Metallization on High Temperature and High Humidity Test of Crystalline Silicon PV Module
Regarding the crystalline Silicon Photovoltaic module in which the corrosion of the front-side metallization occurred form near the bus bars in the high temperature high humidity test, the state of the finger metallization after the test was observed. Corrosion of the glass of the metallization was confirmed as in the previous report. In addition, there was a gap between the bulk Ag and the glass layer. This gap can cause an increase in series resistance between the emitter and the finger bars. Sn was also detected from a part of the corroded metallization surface.
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