基于碳化硅(SiC) MOS电容的氢传感器

B. Ofrim, F. Udrea, G. Brezeanu, A. P. Hsieh
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引用次数: 6

摘要

基于碳化硅(SiC)的MOS电容器器件用于高温和化学反应环境中的气敏。定义并仿真了一种用于氢传感器的SiC MOS电容结构。分析了氢浓度、温度和界面陷阱对C-V特性的影响。对不同氧化层类型(SiO2、TiO2和ZnO)和厚度(50 ~ 10nm)的结构进行了比较。TiO2基结构的性能优于SiO2和ZnO基结构。此外,在较薄的氧化层中,SiC MOS电容器的性能也有所提高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Hydrogen sensor based on silicon carbide (SiC) MOS capacitor
Silicon carbide (SiC) based MOS capacitor devices are used for gas sensing in high temperature and chemically reactive environments. A SiC MOS capacitor structure used as hydrogen sensor is defined and simulated. The effects of hydrogen concentration, temperature and interface traps on C-V characteristics were analysed. A comparison between structures with different oxide layer types (SiO2, TiO2 and ZnO) and thicknesses (50-10nm) was conducted. The TiO2 based structure has better performance than the SiO2 and ZnO structures. Also, the performance of the SiC MOS capacitor increases at thinner oxide layers.
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