实际工作负载下真实电路时延退化的测量结果

{"title":"实际工作负载下真实电路时延退化的测量结果","authors":"K. Shimamura, Takeshi Takehara, Naohiro Ikeda","doi":"10.2197/ipsjtsldm.16.27","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":38964,"journal":{"name":"IPSJ Transactions on System LSI Design Methodology","volume":"22 1","pages":"27-34"},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Measurement Results of Real Circuit Delay Degradation under Realistic Workload\",\"authors\":\"K. Shimamura, Takeshi Takehara, Naohiro Ikeda\",\"doi\":\"10.2197/ipsjtsldm.16.27\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":38964,\"journal\":{\"name\":\"IPSJ Transactions on System LSI Design Methodology\",\"volume\":\"22 1\",\"pages\":\"27-34\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IPSJ Transactions on System LSI Design Methodology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2197/ipsjtsldm.16.27\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IPSJ Transactions on System LSI Design Methodology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2197/ipsjtsldm.16.27","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}