密码系统的正面激光故障注入。在AES最后一轮中的应用

Cyril Roscian, J. Dutertre, A. Tria
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引用次数: 58

摘要

通过集成电路的正面(以及金属填充)进行激光故障注入通常使用中等或较小的激光束,以注入字节级故障。本文研究了大光束(100/im范围内)故障注入的特性。我们还检查了位集(或位复位)故障类型是否仍然存在,或者是否可能遇到位尖故障类型。在ASIC上运行高级加密标准(Advanced Encryption Standard, AES)算法的最后一轮进行了激光注入实验。收集到的数据可以用来研究得到的故障模型,进行两种常见的差分故障攻击(DFA)方案,并提出第三种DFA的简单版本。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Frontside laser fault injection on cryptosystems - Application to the AES' last round -
Laser fault injection through the front side (and consequently the metal-flls) of an IC is often performed with medium or small laser beams for the purpose of injecting bytewise faults. We have investigated in this paper the properties of fault injection with a larger laser beam (in the 100/im range). We have also checked whether the bit-set (or bit-reset) fault type still holds or whether the bit-fip fault type may be encountered. Laser injection experiments were performed during the last round of the Advanced Encryption Standard (AES) algorithm running on an ASIC. The gathered data allowed to investigate the obtained fault models, to conduct two usual Differencial Fault Attack (DFA) schemes and to propose a simple version of a third DFA.
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