用于压电MEMS的外延PZT的商业化生产

Ryoma Miyake, M. Kiuchi, S. Yoshida, Shuji Tanaka, G. Fox
{"title":"用于压电MEMS的外延PZT的商业化生产","authors":"Ryoma Miyake, M. Kiuchi, S. Yoshida, Shuji Tanaka, G. Fox","doi":"10.1109/IFCS-ISAF41089.2020.9234898","DOIUrl":null,"url":null,"abstract":"A commercially produced monocrystalline-like epitaxial PZT film is described for piezoelectric MEMS applications. Films with a thickness of $1\\ \\mu \\mathrm{m}$ to $2\\ \\mu \\mathrm{m}$ exhibit a typical transverse piezoelectric d31 coefficient of −185 pm/V, relative dielectric permittivity of 430 and dielectric loss of 0.015. These films are commercially available for piezoelectric MEMS device development and production.","PeriodicalId":6872,"journal":{"name":"2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)","volume":"27 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Commercial Production of Epitaxial PZT for Piezoelectric MEMS Applications\",\"authors\":\"Ryoma Miyake, M. Kiuchi, S. Yoshida, Shuji Tanaka, G. Fox\",\"doi\":\"10.1109/IFCS-ISAF41089.2020.9234898\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A commercially produced monocrystalline-like epitaxial PZT film is described for piezoelectric MEMS applications. Films with a thickness of $1\\\\ \\\\mu \\\\mathrm{m}$ to $2\\\\ \\\\mu \\\\mathrm{m}$ exhibit a typical transverse piezoelectric d31 coefficient of −185 pm/V, relative dielectric permittivity of 430 and dielectric loss of 0.015. These films are commercially available for piezoelectric MEMS device development and production.\",\"PeriodicalId\":6872,\"journal\":{\"name\":\"2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)\",\"volume\":\"27 1\",\"pages\":\"1-3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IFCS-ISAF41089.2020.9234898\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IFCS-ISAF41089.2020.9234898","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

描述了一种用于压电MEMS应用的商业生产的单晶样外延PZT薄膜。厚度为$1\ \mu \ mathm {m}$至$2\ \mu \ mathm {m}$的薄膜,典型的横向压电d31系数为- 185 pm/V,相对介电常数为430,介电损耗为0.015。这些薄膜可用于压电MEMS器件的开发和生产。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Commercial Production of Epitaxial PZT for Piezoelectric MEMS Applications
A commercially produced monocrystalline-like epitaxial PZT film is described for piezoelectric MEMS applications. Films with a thickness of $1\ \mu \mathrm{m}$ to $2\ \mu \mathrm{m}$ exhibit a typical transverse piezoelectric d31 coefficient of −185 pm/V, relative dielectric permittivity of 430 and dielectric loss of 0.015. These films are commercially available for piezoelectric MEMS device development and production.
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