利用衬底ECAD集成改进热建模

V. Jha, T. Hauck
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引用次数: 1

摘要

近十年来,随着人们对更高的功率密度和更小的封装尺寸的要求,电子封装的热管理变得越来越具有挑战性。由于多个设计参数在热表征参数的评估中起着重要的作用,设计近似会导致很大的误差。基板设计是热模型的一个关键方面,目前最先进的技术从大约的铜夹杂物百分比到手动构建迹线以捕获重要的几何特征不等。通常,这些方法容易产生近似误差,并且在构建几何模型时也很耗时。提出的另一种方法是在封装模型中直接使用衬底ECAD集成,这大大提高了热建模效率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Thermal Modeling Improvements using substrate ECAD integration
With requirements of higher power density and smaller package size, thermal management of electronic packages has become increasingly challenging since last decade. With several design parameters playing an important role in evaluation of thermal characterization parameter, design approximations can lead to significant error. Substrate design is a critical aspect of the thermal model and the current state-of-the-art varies from approximate copper percentage inclusions to manually building traces to capture important geometrical features. Typically, these methods are prone to approximation errors and are also time consuming for building geometric models. An alternate method proposed is to use direct substrate ECAD integration in the package model that significantly improves the thermal modeling efficiency.
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