碳硅太阳能电池的原子层沉积钝化方案

B. V. D. van de Loo, B. Macco, J. Melskens, M. Verheijen, W. Kessels
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引用次数: 5

摘要

综述了c-Si表面钝化领域的最新进展,重点介绍了可以通过原子层沉积(ALD)制备的材料。除了Al2O3外,最近还开发了各种新的钝化方案,如Ga2O3, Ta2O5, SiO2/Al2O3, HfO2/Al2O3和TiO2,它们可以钝化各种掺杂和织构的Si表面。此外,它们在钝化接触的新兴领域中是有趣的候选者,例如作为新型隧道氧化物。在这一领域,ALD可以提供一些明显的优势,如精确控制薄膜厚度、成分,甚至是区域选择性沉积。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Atomic-layer deposited passivation schemes for c-Si solar cells
A review of recent developments in the field of passivation of c-Si surfaces is presented, with a particular focus on materials that can be prepared by atomic layer deposition (ALD). Besides Al2O3, various other novel passivation schemes have recently been developed, such as Ga2O3, Ta2O5, SiO2/Al2O3, HfO2/Al2O3 and TiO2, which altogether can passivate a wider variety of doped and textured Si surfaces. Moreover, they are interesting candidates in the emerging field of passivating contacts, for instance as novel tunnel oxides. In this field, ALD can offer some distinct advantages, such as a precise control in film thickness, composition and even area-selective deposition.
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