{"title":"基于VLSI测试的集成电路伪装安全度量","authors":"Jeyavijayan Rajendran, O. Sinanoglu, R. Karri","doi":"10.1109/TEST.2013.6651879","DOIUrl":null,"url":null,"abstract":"An Integrated Circuit (IC) can be reverse engineered by imaging its layout and reconstructing the netlist. IC camouflaging is a layout-level technique that hampers imaging-based reverse engineering by using, in one embodiment, functionally different standard cells that look alike. Reverse engineering will fail if the functionality of a camouflaged gate cannot be correctly resolved. We adapt VLSI testing principles (justification and sensitization) to quantify the ability of a reverse engineer to unambiguously resolve the functionality of look-alike camouflaged gates. We evaluate the security of look-alike standard cells based IC camouflaging by applying it on the controllers in OpenSPARC T1 processor.","PeriodicalId":6379,"journal":{"name":"2013 IEEE International Test Conference (ITC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2013-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"42","resultStr":"{\"title\":\"VLSI testing based security metric for IC camouflaging\",\"authors\":\"Jeyavijayan Rajendran, O. Sinanoglu, R. Karri\",\"doi\":\"10.1109/TEST.2013.6651879\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An Integrated Circuit (IC) can be reverse engineered by imaging its layout and reconstructing the netlist. IC camouflaging is a layout-level technique that hampers imaging-based reverse engineering by using, in one embodiment, functionally different standard cells that look alike. Reverse engineering will fail if the functionality of a camouflaged gate cannot be correctly resolved. We adapt VLSI testing principles (justification and sensitization) to quantify the ability of a reverse engineer to unambiguously resolve the functionality of look-alike camouflaged gates. We evaluate the security of look-alike standard cells based IC camouflaging by applying it on the controllers in OpenSPARC T1 processor.\",\"PeriodicalId\":6379,\"journal\":{\"name\":\"2013 IEEE International Test Conference (ITC)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"42\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE International Test Conference (ITC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2013.6651879\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Test Conference (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2013.6651879","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
VLSI testing based security metric for IC camouflaging
An Integrated Circuit (IC) can be reverse engineered by imaging its layout and reconstructing the netlist. IC camouflaging is a layout-level technique that hampers imaging-based reverse engineering by using, in one embodiment, functionally different standard cells that look alike. Reverse engineering will fail if the functionality of a camouflaged gate cannot be correctly resolved. We adapt VLSI testing principles (justification and sensitization) to quantify the ability of a reverse engineer to unambiguously resolve the functionality of look-alike camouflaged gates. We evaluate the security of look-alike standard cells based IC camouflaging by applying it on the controllers in OpenSPARC T1 processor.