基于VLSI测试的集成电路伪装安全度量

Jeyavijayan Rajendran, O. Sinanoglu, R. Karri
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引用次数: 42

摘要

集成电路(IC)可以通过对其布局进行成像和重构网表来进行逆向工程。IC伪装是一种布局级技术,通过在一个实施例中使用功能不同但看起来相似的标准单元,阻碍了基于成像的逆向工程。如果不能正确解决伪装门的功能,逆向工程将失败。我们采用VLSI测试原理(论证和敏化)来量化逆向工程师明确解决相似伪装门功能的能力。通过在OpenSPARC T1处理器控制器上的应用,评估了基于相似标准单元的IC伪装的安全性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
VLSI testing based security metric for IC camouflaging
An Integrated Circuit (IC) can be reverse engineered by imaging its layout and reconstructing the netlist. IC camouflaging is a layout-level technique that hampers imaging-based reverse engineering by using, in one embodiment, functionally different standard cells that look alike. Reverse engineering will fail if the functionality of a camouflaged gate cannot be correctly resolved. We adapt VLSI testing principles (justification and sensitization) to quantify the ability of a reverse engineer to unambiguously resolve the functionality of look-alike camouflaged gates. We evaluate the security of look-alike standard cells based IC camouflaging by applying it on the controllers in OpenSPARC T1 processor.
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