N. Miyazaki, H. Ogino, Y. Kitamura, T. Mabuchi, T. Nawata
{"title":"考虑退火过程中钢锭蠕变行为的氟化钙单晶退火钢锭双折射模拟","authors":"N. Miyazaki, H. Ogino, Y. Kitamura, T. Mabuchi, T. Nawata","doi":"10.1109/IMPACT.2009.5382295","DOIUrl":null,"url":null,"abstract":"We developed an analysis system for simulating birefringence of an annealed ingot of CaF2 single crystal caused by the residual stress after annealing process. In the residual stress calculation, we can select either the elastic thermal stress analysis using a stress-free temperature or more exact stress analysis considering creep deformation. When we use the residual stress calculated from the creep deformation analysis of a CaF2 ingot, we can obtain reasonable results in comparison with the experimental results.","PeriodicalId":6410,"journal":{"name":"2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference","volume":"65 1","pages":"2-5"},"PeriodicalIF":0.0000,"publicationDate":"2009-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Birefringence simulations of annealed ingot of calcium fluoride single crystal by considering creep behavior of ingot during annealing process\",\"authors\":\"N. Miyazaki, H. Ogino, Y. Kitamura, T. Mabuchi, T. Nawata\",\"doi\":\"10.1109/IMPACT.2009.5382295\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We developed an analysis system for simulating birefringence of an annealed ingot of CaF2 single crystal caused by the residual stress after annealing process. In the residual stress calculation, we can select either the elastic thermal stress analysis using a stress-free temperature or more exact stress analysis considering creep deformation. When we use the residual stress calculated from the creep deformation analysis of a CaF2 ingot, we can obtain reasonable results in comparison with the experimental results.\",\"PeriodicalId\":6410,\"journal\":{\"name\":\"2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference\",\"volume\":\"65 1\",\"pages\":\"2-5\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMPACT.2009.5382295\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMPACT.2009.5382295","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Birefringence simulations of annealed ingot of calcium fluoride single crystal by considering creep behavior of ingot during annealing process
We developed an analysis system for simulating birefringence of an annealed ingot of CaF2 single crystal caused by the residual stress after annealing process. In the residual stress calculation, we can select either the elastic thermal stress analysis using a stress-free temperature or more exact stress analysis considering creep deformation. When we use the residual stress calculated from the creep deformation analysis of a CaF2 ingot, we can obtain reasonable results in comparison with the experimental results.