{"title":"恒定电场和磁场对半导体晶体结构畸变的x射线干涉研究","authors":"E. Arshakyan, A. Aboyan, P. A. Bezirganyan","doi":"10.1002/PSSA.2211060106","DOIUrl":null,"url":null,"abstract":"The effect of constant electric and magnetic fields on the silicon semiconductor crystals is investigated experimentally. It is shown that electric and magnetic fields create structural distortions leading to changes in X-Ray interferometric pictures, which depend on the magnitude of the applied field. At certain values of the intensity of electric field and the induction of magnetic field, the Moire pictures disappear.","PeriodicalId":18217,"journal":{"name":"March 16","volume":"15 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"1988-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"X-Ray Interferometric Investigations of Structural Distortions in Semiconductor Crystals Caused by Constant Electric and Magnetic Fields\",\"authors\":\"E. Arshakyan, A. Aboyan, P. A. Bezirganyan\",\"doi\":\"10.1002/PSSA.2211060106\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The effect of constant electric and magnetic fields on the silicon semiconductor crystals is investigated experimentally. It is shown that electric and magnetic fields create structural distortions leading to changes in X-Ray interferometric pictures, which depend on the magnitude of the applied field. At certain values of the intensity of electric field and the induction of magnetic field, the Moire pictures disappear.\",\"PeriodicalId\":18217,\"journal\":{\"name\":\"March 16\",\"volume\":\"15 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-03-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"March 16\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1002/PSSA.2211060106\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"March 16","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/PSSA.2211060106","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
X-Ray Interferometric Investigations of Structural Distortions in Semiconductor Crystals Caused by Constant Electric and Magnetic Fields
The effect of constant electric and magnetic fields on the silicon semiconductor crystals is investigated experimentally. It is shown that electric and magnetic fields create structural distortions leading to changes in X-Ray interferometric pictures, which depend on the magnitude of the applied field. At certain values of the intensity of electric field and the induction of magnetic field, the Moire pictures disappear.