基于硅量子点的光学探针荧光检测Cr6+离子

Duc Tho Do, Van Nam Luyen, Thi My Huyen Nguyen, Manh Hung Pham, V. Pham, T. N. L. Truong
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引用次数: 0

摘要

本文采用水热法合成了具有NH2官能团的硅量子点。在所制备的SiQDs在355 nm处激发时,在441 nm处有很强的荧光发射峰,加入Cr6+离子后,SiQDs被有效猝灭。因此,siqd被用作光学探针来检测溶液中的Cr6+离子。利用x射线衍射(XRD)对SiQDs的晶体结构进行了表征。利用傅里叶变换红外光谱(FT-IR)测定了siqd表面的连接基团。采用激发波长为355nm的荧光光谱技术定量测定0.1 ~ 1000µM范围内溶液中的Cr6+离子浓度。来自共同存在的离子,如K+、Na+、Al3+、Zn2+和Pb2+的竞争是可以忽略的。实际样品的测试表明,在0.1 ~ 50µM的浓度范围内,Cr6+呈良好的线性关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Silicon quantum-dots-based optical probe for fluorometric detection of Cr6+ ions
In this report, silicon quantum dots (SiQDs) with the NH2 functional group were synthesized with the hydrothermal method. The as-prepared SiQDs exhibit a strong fluorescence emission peak               at 441 nm when excited at 355 nm and are effectively quenched upon adding Cr6+ ions. Hence, SiQDs were used as an optical probe to detect Cr6+ ions in solutions. The crystal structure of SiQDs was characterized by using X-ray diffraction (XRD). The Fourier-transform infrared spectroscopy (FT-IR) was used to determine the linker groups on the SiQDs surface. The fluorescence spectroscopic technique with an excitation wavelength of 355 nm was used to quantify the Cr6+ ion concentration in the solutions in the range of 0.1–1000 µM. Competition from common coexisting ions, such as K+, Na+, Al3+, Zn2+, and Pb2+, was ignorable. The test with actual samples showed good linearity for the Cr6+ concentration range of 0.1–50 µM.
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