H. Kawasaki, Kenji Matsumoto, H. Nagai, Yuuki Kikuchi, Peng Chang
{"title":"Cu/低钾互连中Cu覆盖层MnOx的原子层沉积","authors":"H. Kawasaki, Kenji Matsumoto, H. Nagai, Yuuki Kikuchi, Peng Chang","doi":"10.1109/IITC.2014.6831896","DOIUrl":null,"url":null,"abstract":"We demonstrated atomic layer deposition (ALD) of manganese oxide (MnOx) for Cu capping layer. This process is expected to have not only EM (electro-migration) improvement but also admissibility of surface Cu oxidation. That will provide easy time and atmosphere management after chemical mechanical polishing (CMP). In this study, we confirmed Mn(Ox) coverage on Cu without degradation of leakage current and indication of EM improvement with simple EM test.","PeriodicalId":6823,"journal":{"name":"2021 IEEE International Interconnect Technology Conference (IITC)","volume":"1 1","pages":"315-318"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Atomic layer deposition of MnOx for Cu capping layer in Cu/low-k interconnects\",\"authors\":\"H. Kawasaki, Kenji Matsumoto, H. Nagai, Yuuki Kikuchi, Peng Chang\",\"doi\":\"10.1109/IITC.2014.6831896\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We demonstrated atomic layer deposition (ALD) of manganese oxide (MnOx) for Cu capping layer. This process is expected to have not only EM (electro-migration) improvement but also admissibility of surface Cu oxidation. That will provide easy time and atmosphere management after chemical mechanical polishing (CMP). In this study, we confirmed Mn(Ox) coverage on Cu without degradation of leakage current and indication of EM improvement with simple EM test.\",\"PeriodicalId\":6823,\"journal\":{\"name\":\"2021 IEEE International Interconnect Technology Conference (IITC)\",\"volume\":\"1 1\",\"pages\":\"315-318\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE International Interconnect Technology Conference (IITC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IITC.2014.6831896\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Interconnect Technology Conference (IITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IITC.2014.6831896","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Atomic layer deposition of MnOx for Cu capping layer in Cu/low-k interconnects
We demonstrated atomic layer deposition (ALD) of manganese oxide (MnOx) for Cu capping layer. This process is expected to have not only EM (electro-migration) improvement but also admissibility of surface Cu oxidation. That will provide easy time and atmosphere management after chemical mechanical polishing (CMP). In this study, we confirmed Mn(Ox) coverage on Cu without degradation of leakage current and indication of EM improvement with simple EM test.