反射高能电子衍射法研究晶体表面

Journal of The Vacuum Society of Japan Pub Date : 2016-01-01 DOI:10.3131/JVSJ2.59.19

A. Ichimiya

{"title":"反射高能电子衍射法研究晶体表面","authors":"A. Ichimiya","doi":"10.3131/JVSJ2.59.19","DOIUrl":null,"url":null,"abstract":"December 14, 2015 ） The re‰ection high-energy electron diŠraction ( RHEED ) is a powerful tool for surface studies and widely used for surface structural analysis in monitoring epitaxial growth. In this article, it is described that RHEED is developed as a tool in surface studies such as structure determination of crystal surfaces, evolution of surface structures by epitaxial growth and monitoring thin ˆlm growth processes. Recent novel RHEED techniques for surface structural","PeriodicalId":17344,"journal":{"name":"Journal of The Vacuum Society of Japan","volume":"151 1","pages":"19-25"},"PeriodicalIF":0.0000,"publicationDate":"2016-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Crystal Surface Studies by Reflection High-Energy Electron Diffraction\",\"authors\":\"A. Ichimiya\",\"doi\":\"10.3131/JVSJ2.59.19\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"December 14, 2015 ） The re‰ection high-energy electron diŠraction ( RHEED ) is a powerful tool for surface studies and widely used for surface structural analysis in monitoring epitaxial growth. In this article, it is described that RHEED is developed as a tool in surface studies such as structure determination of crystal surfaces, evolution of surface structures by epitaxial growth and monitoring thin ˆlm growth processes. Recent novel RHEED techniques for surface structural\",\"PeriodicalId\":17344,\"journal\":{\"name\":\"Journal of The Vacuum Society of Japan\",\"volume\":\"151 1\",\"pages\":\"19-25\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of The Vacuum Society of Japan\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.3131/JVSJ2.59.19\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of The Vacuum Society of Japan","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3131/JVSJ2.59.19","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

re‰高能电子diŠraction (RHEED)是一种强大的表面研究工具，广泛用于监测外延生长的表面结构分析。在本文中，描述了RHEED是作为表面研究的工具而发展起来的，例如晶体表面的结构测定，通过外延生长和监测薄膜生长过程的表面结构演变。表面结构的新型RHEED技术

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Crystal Surface Studies by Reflection High-Energy Electron Diffraction

December 14, 2015 ） The re‰ection high-energy electron diŠraction ( RHEED ) is a powerful tool for surface studies and widely used for surface structural analysis in monitoring epitaxial growth. In this article, it is described that RHEED is developed as a tool in surface studies such as structure determination of crystal surfaces, evolution of surface structures by epitaxial growth and monitoring thin ˆlm growth processes. Recent novel RHEED techniques for surface structural

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Journal of The Vacuum Society of Japan

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