一种用于低压SRAM的位线泄漏补偿方案

2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103) Pub Date : 2000-06-15 DOI:10.1109/VLSIC.2000.852854

K. Agawa, H. Hara, T. Takayanagi, T. Kuroda

{"title":"一种用于低压SRAM的位线泄漏补偿方案","authors":"K. Agawa, H. Hara, T. Takayanagi, T. Kuroda","doi":"10.1109/VLSIC.2000.852854","DOIUrl":null,"url":null,"abstract":"The bit-line leakage current of an SRAM, induced by transistor leakage at low V/sub DD/ and dependent on cell data associated with the bit-line, is detected in a pre-charge cycle and compensated for during a read/write cycle. By this scheme, V/sub th/ can be lowered to 0.23 V/sub DD/ in a 0.07 /spl mu/m/1.0 V CMOS, as it was before, keeping V/sub th/ and delay scalability of the high-speed SRAM.","PeriodicalId":6361,"journal":{"name":"2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)","volume":"29 1","pages":"70-71"},"PeriodicalIF":0.0000,"publicationDate":"2000-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"A bit-line leakage compensation scheme for low-voltage SRAM's\",\"authors\":\"K. Agawa, H. Hara, T. Takayanagi, T. Kuroda\",\"doi\":\"10.1109/VLSIC.2000.852854\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The bit-line leakage current of an SRAM, induced by transistor leakage at low V/sub DD/ and dependent on cell data associated with the bit-line, is detected in a pre-charge cycle and compensated for during a read/write cycle. By this scheme, V/sub th/ can be lowered to 0.23 V/sub DD/ in a 0.07 /spl mu/m/1.0 V CMOS, as it was before, keeping V/sub th/ and delay scalability of the high-speed SRAM.\",\"PeriodicalId\":6361,\"journal\":{\"name\":\"2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)\",\"volume\":\"29 1\",\"pages\":\"70-71\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-06-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2000.852854\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2000.852854","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 17

摘要

SRAM的位线泄漏电流由低V/sub DD/时晶体管泄漏引起，并依赖于与位线相关的单元数据，在预充电周期中检测并在读/写周期中补偿。通过该方案，在0.07 /spl mu/m/1.0 V CMOS中，V/sub /可以降低到0.23 V/sub / DD/，保持了高速SRAM的V/sub /和延迟可扩展性。

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A bit-line leakage compensation scheme for low-voltage SRAM's

The bit-line leakage current of an SRAM, induced by transistor leakage at low V/sub DD/ and dependent on cell data associated with the bit-line, is detected in a pre-charge cycle and compensated for during a read/write cycle. By this scheme, V/sub th/ can be lowered to 0.23 V/sub DD/ in a 0.07 /spl mu/m/1.0 V CMOS, as it was before, keeping V/sub th/ and delay scalability of the high-speed SRAM.

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来源期刊

2000 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.00CH37103)

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