Shuhei Yoshida, Go Matsukawa, S. Izumi, H. Kawaguchi, M. Yoshimoto
{"title":"考虑再收敛路径上逻辑掩蔽效应的软误差传播分析","authors":"Shuhei Yoshida, Go Matsukawa, S. Izumi, H. Kawaguchi, M. Yoshimoto","doi":"10.1109/IOLTS.2016.7604661","DOIUrl":null,"url":null,"abstract":"This paper presents an accurate soft error propagation analysis technique. Especially, we focus on Single Event Upset (SEU) in flip-flop. The proposed technique can calculate the accurate error propagation probability considering logical masking on re-convergent paths with SAT solver efficiently. Experimental result shows that the proposed technique improves the computation time by 94.6% compared with the method with only SAT solver and the accuracy by 93.3% compared with the conventional method respectively.","PeriodicalId":6580,"journal":{"name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"52 1","pages":"13-16"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"An soft error propagation analysis considering logical masking effect on re-convergent path\",\"authors\":\"Shuhei Yoshida, Go Matsukawa, S. Izumi, H. Kawaguchi, M. Yoshimoto\",\"doi\":\"10.1109/IOLTS.2016.7604661\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an accurate soft error propagation analysis technique. Especially, we focus on Single Event Upset (SEU) in flip-flop. The proposed technique can calculate the accurate error propagation probability considering logical masking on re-convergent paths with SAT solver efficiently. Experimental result shows that the proposed technique improves the computation time by 94.6% compared with the method with only SAT solver and the accuracy by 93.3% compared with the conventional method respectively.\",\"PeriodicalId\":6580,\"journal\":{\"name\":\"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)\",\"volume\":\"52 1\",\"pages\":\"13-16\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IOLTS.2016.7604661\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2016.7604661","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An soft error propagation analysis considering logical masking effect on re-convergent path
This paper presents an accurate soft error propagation analysis technique. Especially, we focus on Single Event Upset (SEU) in flip-flop. The proposed technique can calculate the accurate error propagation probability considering logical masking on re-convergent paths with SAT solver efficiently. Experimental result shows that the proposed technique improves the computation time by 94.6% compared with the method with only SAT solver and the accuracy by 93.3% compared with the conventional method respectively.