片上网络中互连短时间寻址的在线测试解决方案

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2016-07-04 DOI:10.1109/IOLTS.2016.7604660

B. Bhowmik, J. Deka, S. Biswas

{"title":"片上网络中互连短时间寻址的在线测试解决方案","authors":"B. Bhowmik, J. Deka, S. Biswas","doi":"10.1109/IOLTS.2016.7604660","DOIUrl":null,"url":null,"abstract":"This paper presents a scalable time optimized online test solution that addresses short faults in interconnects of an on-chip network (NoC) and observes the deep impact of these faults on NoC performance at large traffics.","PeriodicalId":6580,"journal":{"name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"30 1","pages":"9-12"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"An on-line test solution for addressing interconnect shorts in on-chip networks\",\"authors\":\"B. Bhowmik, J. Deka, S. Biswas\",\"doi\":\"10.1109/IOLTS.2016.7604660\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a scalable time optimized online test solution that addresses short faults in interconnects of an on-chip network (NoC) and observes the deep impact of these faults on NoC performance at large traffics.\",\"PeriodicalId\":6580,\"journal\":{\"name\":\"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)\",\"volume\":\"30 1\",\"pages\":\"9-12\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IOLTS.2016.7604660\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2016.7604660","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 9

摘要

本文提出了一种可扩展的时间优化在线测试解决方案，用于解决片上网络(NoC)互连中的短故障，并观察了这些故障在大流量下对NoC性能的深刻影响。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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An on-line test solution for addressing interconnect shorts in on-chip networks

This paper presents a scalable time optimized online test solution that addresses short faults in interconnects of an on-chip network (NoC) and observes the deep impact of these faults on NoC performance at large traffics.

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来源期刊

2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)

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